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ACCOUNTABILITY AND TRANSPARENCY IN THE GERMAN NONPROFIT SECTOR: A PARADOX?
HELMUT K. ANHEIER,RABEA HASS,ANNELIE BELLER 한국행정학회 2013 International Review of Public Administration Vol.18 No.3
The article draws on exploratory research on the accountability and transparency of nonprofit organizations, using Germany as an example. In terms of accountability and transparency requirements, so frequently put forth and debated in the U.S., the UK, and other countries where nonprofits play major roles in social service delivery and public sector reform, the German case presents somewhat of a puzzle: while nonprofits account indeed for a sizable share of social service delivery, and while some of the world´s largest nonprofit conglomerates are in Germany, initial findings suggest an apparent “non-problem.” Both accountability and transparency requirements in the German nonprofit sector are rather low and largely part of formalistic reporting to tax authorities. What is more, there is a general paucity of available information on nonprofit organizations, combined with low levels of awareness among stakeholders as to potential accountability and transparency problems, and a lack of political will among nonprofit representatives and policymakers to change the status quo. In conclusion, we propose five theses to help explain this seeming paradox.
An Automatic Test Pattern Generator for Sequential Circuits with Three-State Elements
Cheon,Beom Ik,Anheier,Walter,Laur,Rainer 대한전자공학회 1997 ICVC : International Conference on VLSI and CAD Vol.5 No.1
We introduce BRAHMS, a deterministic test pattern generator for the stuck-at fault model which generates the test patterns for sequential circuits containing not only the primitive logic gates but also the three-state elements, such as buses and bus drives, transmission gates, tristate gate, bi-directional input/output etc. BRAHMS uses a 16-valued signal model, and the FAN-and the BACK-algorithm are modified for generating test patterns efficiently.
AN AUTOMATIC TEST PATTERN GENERATOR FOR PARALLEL AND DISTRIBUTED SYSTEMS
Radtke,Stefan,Krebs,Wolfgang,Anheier,Walter 대한전자공학회 1995 ICVC : International Conference on VLSI and CAD Vol.4 No.1
The generation of test patterns for digital circuits is known as a NP hard problem (2) The most time consuming factor in generating test patterns for digital circuits is the backtracking mechanism. Due to this mechanism it is difficult to speed up the process. In this paper we present a parallel formulation of the FAN algorithm (3) implemented on a cluster of workstations. Two different methods are used to take into account easy- and hard-to-detect faults. We'tl show the strategies for our parallel implementations as well as implementaion details. We will show that we can accelerate the generation process witk an increasing number of workstations used For some cases we achieve linear speedup as we will show in Section 4. The reader should be familiar with notations of the FAN algorithm.