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나노 옥사이드 층을 가진 스펙큘라 스핀밸브의 자기저항 특성 및 교환바이어스의 열처리 온도 의존성
장성호(S. H. Jang),강탁(T. Kang),김희중(H. J. Kim),김광윤(K. Y. Kim) 한국자기학회 2002 韓國磁氣學會誌 Vol.12 No.3
We investigated magnetoresistance(MR) and exchange bias properties by annealing in top and bottom type spin valves (SV) with nano-oxide layers (NOL). In top SVs with NOL, MR ratio of 9.2 % is obtained after postdeposition annealing at 250 ℃. In bottom SVs with NOL, MR ratio of 10.1 % is obtained after postdeposition annealing at 250 ℃. Therefore, specular reflection of the NOL in bottom SVs is higher than that of the NOL in top SVs. Exchange biasing of bottom SVs with NOL is 28 % higher than that of bottom SVs without NOL after annealing. This enhancement of exchange biasing is thought to be due to the reduced magnetic moment of the pinned laver with NOL and enhanced (111) FeMn texture.
Synthetic antiferromagnet CoFe / Ru / CoFe / FeMn을 이용한 스핀 밸브 구조의 자기저항 특성
장성호(S.H. Jang),강탁(T. Kang),김민정(M.J. Kim),김희중(H.J. Kim),김광윤(K.Y. Kim) 한국자기학회 2000 韓國磁氣學會誌 Vol.10 No.5
Top synthetic spin valves with structure Ta/NiFe/CoFe/Cu/CoFe(P1)/Ru/CoFe(P2)/FeMn/Ta on Si(100) substrate with natural oxide were prepared by dc magnetron sputtering system, and investigated on the magnetoresistance properties and effective exchange bias field. As the thickness of FeMn increased above 150 Å, MR ratio was decreased due to the current shunting effect. As the thickness of free layer decreased below 40Å, MR ratio was reduced rapidly. In case of 40 Å thick of free layer, spin valve film with a structure Si(100)/Ta(50 Å)/NiFe(27 Å)/CoFe(13 Å)/Cu(26 Å)/CoFe(30 Å)/Ru(7 Å)/CoFe(15 Å)/FeMn(100 Å)/Ta(50 Å) exhibited maximum MR ratio of 7.5 % and an effective exchange bias field of 600 Oe, respectively. Thickness difference dependence in this synthetic spin valve structure on effective exchange field was investigated and interpreted by the analytical method. It should be noted that thickness increase of CoFe(P1) and decrease of CoFe(P2) in synthetic antiferromagnet leaded to the decrease in effective exchange bias field by experimentally and analytically.