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이학주(H. J. Lee),최병익(B. I. Choi),김완두(W. D. Kim),오충석(C. S. Oh),한승우(S. W. Han),허신(S. Hur),김재현(J. H. Kim),고순규(S. G. Ko),안현균(H. G. Ahn) 대한기계학회 2003 대한기계학회 춘추학술대회 Vol.2003 No.4
There are many applications of nanostructures, have been suggested by lots of researchers. It is<br/> highly required to measure the properties of nano-sized materials for design and fabrication of the<br/> nanostructures. In this paper, several techniques for measuring the mechanical properties of<br/> nano-structures are presented laying emphasis on the activity of Nano Property Measurement Team in<br/> KIMM. Some advanced applications of nano-indenter are described for measuring elastic, visco-elastic,<br/> frictional and adhesive properties as well as the standard methods of it. Micro-tensile test technique<br/> with accurate in-plane strain measurement method is also presented and its role in the property<br/> measurement of nanostructures is discussed.
응력 및 표면 고장물리를 고려한 MEMS 신뢰성 설계 기술
이학주(Hak-Joo Lee),김정엽(Jung Yup Kim),이상주(Sang Joo Lee),최현주(Hyun Ju Choi),김경식(Kyung Shik Kim),김장현(J.-H Kim) 대한기계학회 2007 대한기계학회 춘추학술대회 Vol.2007 No.5
As semiconductor and MEMS devices become smaller, testing process during their production should follow such a high density trend. A circuit inspection tool probe card makes contact with electrode pads of the device under test (DUT). Nowadays, electrode pads are irregularly arranged and have height difference. In order to absorb variations in the heights of electrode pads and to generate contact loads, contact probes must have some levels of mechanical spring properties. Contact probes must also yield a force to break the surface native oxide layer or contamination layer on the electrodes to make electric contact. In this research, new vertical micro contact probe with bellows shape is developed to overcome shortage of prior work. Especially, novel bellows shape is used to reduce stress concentration in this design and stopper is used to change the stiffness of micro contact probe. Variable stiffness can be one solution to overcome the height difference of electrode pads.
유전자 알고리즘을 이용한 유도 전동기 Cascade PI 제어기 설계
이학주(H.J. Lee),권성철(S.C. Kwon),양승권(S.K. Yang),한승호(S.H. Han) 전력전자학회 2003 전력전자학술대회 논문집 Vol.2003 No.7(2)
In this paper, we describe a design procedure for cascade controller for induction motor drives based on Genetic Algorithms(GAs). Most electric drives have two separate controllers for current and speed control, which are in general designed in two consecutive steps (firstly the current controller and then the speed controller). We search simultaneously for the couple of discrete anti-windup controllers achieving the optimal compromise of weighted cost and performance indices related to both current and speed responses.<br/>
마름모형 AFM 캔틸레버를 이용한 고분자 나노섬모의 점착력 측정
이학주(H-J Lee),조기호(K-H Cho),김재현(J-H Kim),유영은(Y-E Yoo),김완두(W-D Kim),김종만(J-M Kim),김용권(Y-K Kim),백창욱(C-W Baek) 대한기계학회 2005 대한기계학회 춘추학술대회 Vol.2005 No.11
In the previous works, the success of rhombus-shaped AFM cantilever manufactured by standard MEMS process has been already proved by performing mechanical bending tests at a micro/nano-scale. In this paper, nano-newton scale adhesive force between micro/nano hair structure and silicon tip is measured by AFM at the atmospheric condition. A nano-hair structure of cyclic olefin copolymer (COC) is fabricated using an anodized aluminum oxide template. The diameter and the length of the nano-hair are approximately 150 ㎚ and 10 ㎛, respectively. This paper outlines a research process that encompasses: 1) design and fabrication of a symmetric rhombus-shaped AFM cantilever, 2) fabrication process of a polymeric nano-hair structure, and 3) adhesion test of nano-hair structure using the manufactured cantilever.
나노인덴테이션을 이용한 나노 임프린트된 폴리머 박막의 잔류두께 측정기법
이학주(H.J. Lee),고순규(S.G. Ko),김재현(J.H. Kim),허 신(S. Hur),이응숙(E.S. Lee),정준호(J.H. Jeong) 대한기계학회 2003 대한기계학회 춘추학술대회 Vol.2003 No.11
Nano-imprint technology has been vigorously studied by many researchers for it is one of the<br/> most promising technologies for manufacturing the pattern with its critical dimension below 100nm. In<br/> the nano-imprint technology, nano patterns are transferred on a polymer film and the transferred<br/> patterns are used as an etch mask to define the designed patterns on a substrate or a metal layer. To<br/> this end, it is important to keep the residual thickness of the imprinted polymer film uniform. In this<br/> study, a novel measurement technique to measure the residual thickness of films is proposed based on<br/> nanoindentation theory. This technique has advantages of saving time and measuring the residual<br/> thickness of highly-localized portions in comparison with other techniques, but has limitation of<br/> requiring calibration process.