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Second Harmonic Generation from Bi3.75La0.25Ti3O12 Thin Films Grown by Sol-gel Method
민해식,전윤남,Sungmin Park,Hyosang Kwon,Jaemoon Pak,Doyoung Park,Sanghoon Song,정현식,박광서,김현정,김도석 한국물리학회 2009 THE JOURNAL OF THE KOREAN PHYSICAL SOCIETY Vol.55 No.3
Ferroelectric Bi3.75La0.25Ti3O12 (BLT) thin films were grown on Pt(111)/Ti/SiO2/Si substrates by repeatedly using the sol-gel method at an 800 C annealing temperature. Varying the film thickness via the number of applied sol-gel processes hardly changed the bulk structure as verified by X-ray diffraction and Raman spectroscopy. The optical second-harmonic signal showed no appreciable change either while the phase of the generated second-harmonic signal increased gradually with the film’s thickness, suggesting that the second-harmonic signal originated from the buried, bottom BLT layer.
Determination of the Crystalline x-Axis of Quartz by Second-Harmonic Phase Measurement
전윤남,Doeok Kim,민해식 한국물리학회 2005 THE JOURNAL OF THE KOREAN PHYSICAL SOCIETY Vol.46 No.2
Second-harmonic phase measurement was used to determine the x-axis (including the direction) of y-cut quartz crystal by measuring the phase of the secondharmonic signal. The reference secondharmonic signal for the determination of the phase was generated from 50-μm-thick reference quartz (z-cut quartz) in the beam path after the sample. Clear interference fringes were observed by changing the relative phase between the second-harmonic electric field from the sample and the reference by rotating the fused quartz plate in between. The second-harmonic signal with input field parallel to the x-axis became different from that with input field antiparallel to the x-axis in the presence of an interfering reference field, thus allowing us to etermine the direction of the crystalline axis of quartz.