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고진공 주사탐침열파현미경을 이용한 Bi₂Te₃ 나노선의 열전도도 계측
박경배(Kyungbae Park),황광석(Gwangseok Hwang),김하영(Hayeong Kim),김정원(Jungwon Kim),권오명(Ohmyoung Kwon),김성진(Sungjin Kim),김우철(Woochul Kim) 대한기계학회 2015 대한기계학회 춘추학술대회 Vol.2015 No.11
We develop the thermal characterization technique for measuring the thermal conductivity of the nanomaterials by utilizing the High Vacuum Scanning Thermal Wave Microscopy(HV-STWM), which enables to measure the phase lag and amplitude of thermal waves quantitatively with nanoscale spatial resolution in a high vacuum environment. The HV-SWTM measurement method obtains the thermal conductivity by measuring the thermal diffusivity, which has only a phase lag relative to the distance corresponding to the transferred thermal wave. It is not affected by the thermal contact resistances between the heat source and nanostructure and between the nanostructure and probe. In this study, we quantitatively measure the thermal conductivity of the Bi₂Te₃ nanowire(1.47 W/mK), with the newly developed thermal characterization method based on HV-STWM.