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Sung-KyuPark,Jeong-InHan,Dae-GyuMoon,Won-KeunKim 한국전기전자재료학회 2002 Transactions on Electrical and Electronic Material Vol.3 No.2
This paper gives the basic mechanical properties of indium-tin-oxide (ITO) films on polymer substrates which are exposed to externally and thermally induced bending force. By using modified Storney formula including triple layer structure and bulge test measuring the conductive changes of patterned ITO islands as a function of bending curvature, the mechanical stability of ITO films on polymer substrates was intensively investigated. The numerical analyses and experimental results show thermally and externally induced mechanical stresses in the films are responsible for the difference of thermal expansion between the ITO film and the substrate, and for substrate material and its thickness, respectively. Therefore, a gradually ramped heating process and an organic buffer layer were employed to improve the mechanical stability, and then, the effects of the buffer layer were also quantified in terms of conductivity-strain variations. As a result, it is uncovered that a buffer layer is also a critical factor determining the magnitude of mechanical stress and the layer with the Young‘s modulus lower than a specific value can contribute to relieving the mechanical stress of the films.
Wavefront Measuring Algorithm with Improved Measurement Resolution Using a Shack-Hartmann Sensor
Seung-KyuPark,Sung-HoonBaik,Young-SeokSeo,Cheol-JungKim,SungWoongRa 한국물리학회 2003 THE JOURNAL OF THE KOREAN PHYSICAL SOCIETY Vol.42 No.6
An adaptive optics system needs to rapidly and accurately compensate for wavefront distortions within limit time. There is a trade-o between the measurement resolution and the measurement speed for an adaptive optics system using a Shack-Hartmann sensor. In this paper, we studied a fastmeasuring algorithm for measuring a wavefront with high resolution to improve the performance of an adaptive optics system. We investigated the relation between the measurement resolution and the measurement speed by using several measuring techniques of the wavefront. After the experiments, we decided on optimal conditions of signal processors for a wavefront measuring device using a Shack-Hartmann sensor and proposed an advanced estimated weighting factor to rapidly calculate the wavefront with a high measurement resolution. The wavefront measuring results and the relation between the measurement resolution and the measurement speed are shown and discussed in this paperd