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DC and RF Performance Analysis of Extended Field Plated AlGaN/GaN/β-Ga2O3 HEMT
R. Karpagam,S. Leones Sherwin Vimalraj,G. K. Sathishkumar,V. Megala,Y. Gowthami,B. Balaji 한국전기전자재료학회 2023 Transactions on Electrical and Electronic Material Vol.24 No.5
In this work, High Electron Mobility Transistor is grown on various Substrates such as silicon (Si), silicon carbide (SiC), and sapphire substrate to exhibit a negative threshold voltage, whereas grown on β-gallium oxide (β-Ga2O3) to exhibit a positive threshold voltage. The optimization is done by using the pi-shaped gate and filed plate towards the drain and triple tooth metal for the proposed structure. In this, work Al0.8Ga0.2 N /AlN /GaN /AlN /Al0.4Ga0.6 N /GaN /AlN / Al0.8Ga0.2 N / β-Ga2O3 HEMT is proposed to improve the breakdown voltage, subthreshold swing. Β-Ga2O3 is prominent material to reduce the leakage current in the structure. It is observed from the obtained results that the Breakdown voltage for Si is 15 V, SiC is 20 V, Sapphire is 114 V, β-Ga2O3 is 125 V,d Unilateral power gain of 21.12dB, 19.56dB, 18.9dB, 9.5dB, at 851 GHz, 774 GHz, 738 GHz, 318 GHz when the proposed structure is grown on β-Ga2O3, SiC, Sapphire, Si substrates. In the proposed HEMT there is a compromise between frequency and breakdown voltage. If one factor improves the other reduces. But by using β-Ga2O3 as a substrate the achievement of both factors is possible. This is possible because of properly layering hetero-materials with matched lattice constant. β-Ga2O3 is a material that is a trend in the market and which resulted in intensive research. In the proposed structure Ferroelectric material i.e. lead Zirconate titanate oxide (PbZrTiO3) is used as a gate to reduce the power consumption and to increase the storage capacity in a unit area. Ferroelectric materials possess elevated dielectric constant and it has the capability of storing more charge per unit area when compared to other materials. In the small area, this material can store more data with low power consumption.
Applying Novel Mean Residual Life Confidence Intervals
Guess, F.M.,Steele, J.C.,Young, T.M.,Leon, R.V. The Korean Reliability Society 2006 International Journal of Reliability and Applicati Vol.7 No.2
Typical confidence intervals for a mean or mean residual life (MRL) are centered about the mean or mean residual life. We discuss novel confidence intervals that produce statements like "we are 95% confident that the MRL function, e(t), is greater than a prespecified $\mu_o$ for all t in the interval [0, $\hat{\theta})$)" where $\hat{\theta}$ is determined from the sample data, confidence level, and $\mu_o$. Also, we can have statements like 'we are 95% confident that the MRL of population 1, namely $e_1$(t), is greater than the MRL of population 2, $e_2$(t), for all t in the interval [0, $\hat{\theta}$)" where $\hat{\theta}$ is determined from the sample data and confidence level. We illustrate these one and two sample confidence intervals on internal bonds (tensile strengths) for an important modem engineered wood product, called medium density fiberboard (MDF), used internationally.
Exploring Reliability of Oriented Strand Board's Tensile and Stiffness Strengths
Wang, Y.,Young, T.M.,Guess, F.M.,Leon, R.V. The Korean Reliability Society 2007 International Journal of Reliability and Applicati Vol.8 No.1
In this paper, we apply insightful statistical reliability tools to manage and seek improvements in the strengths of Oriented Strand Board (OSB). As a part of the OSB manufacturing process, the product undergoes destructive testing at various intervals to determine compliance with customers' specifications. Workers perform these tests on sampled cross sections of the OSB panel to measure the tensile strength, also called internal bond (IB), in pounds per square inches until failure. Additional stiffness strength tests include parallel and perpendicular elasticity indices (EI), which are taken from cross sectional samples of the OSB panel in the parallel and perpendicular directions with respect to the orientation of the wood strands. We explore both graphically and statistically these "pressure-to-failures" of OSB. Also, we briefly comment on reducing sources of variability in the IB and EI of OSB.
Using Reliability Tools to Characterize Wood Strand Thickness of Oriented Strand Board Panels
J. S. Chastain,T. M. Young,F. M. Guess,R. V. Leon 한국신뢰성학회 2009 International Journal of Reliability and Applicati Vol.10 No.2
Oriented Strand Board (OSB) is an important engineered wood product used in housing construction which has a lower environmental impact or “carbon footprint.” In this paper, reliability and statistical tools are applied to gain insights on the strand thickness of OSB panels. An OSB panel consists of several hundred wood strands that are resinated and pressed. The variability of OSB strand thickness for six manufacturers in the Eastern United States is examined as a whole, as well as individually. Little research exists on OSB strand thickness across mills even though strand thickness variability has been documented in laboratory experiments to greatly influence the dimensional stability of OSB panels. Our aims are to quantify and characterize strand thickness, plus apply reliability techniques, such as Kaplan-Meier curves, to characterize the probability of strand thickness. We further explore graphically and statistically the thickness of the strands.