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- 저자 : Lydia Alvarez (검색결과 1 건)
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Resolution Dependence of Scanning Near Field Optical Microscopy on Probe Sample Distance
Lydia Alvarez,Mufei Xiao 한국물리학회 2005 THE JOURNAL OF THE KOREAN PHYSICAL SOCIETY Vol.47 No.1
In scanning near-field optical microscopy (SNOM) a probe tip scans the sample surface in nanometric distances. In such short distances, the probe tip interacts mainly with the evanescent field where diffraction is exempted. Therefore, SNOM may obtain resolution much beyond the diffraction Abbe-Rayleigh limit. In SNOM, one of the most critical parameters is the probe-sample distance. Specifically, the resolution of the microscope varies dramatically with distance. In the present work, we have studied numerically the resolution dependence of collecting mode SNOM on the probe-sample distance. The calculations were based on the direct moment method (DMM). Our attention was concentrated particularly on the influence of the probe-sample distance to the resolution; the distance between probe and sample has proved to be critical. In the calculations the probe tip was modeled as a sub-wavelength aperture in a perfectly conducting wall attached to a lossless step-index cylindrical dielectric waveguide. Within the above framework, we are able to discuss the resolution dependence on the probe-sample distance, as well as its relation to other parameters such as permittivity of the core and cladding, core radius and aperture radius.
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