DC Parameter Test System 개발

金俊植,愼漢重 호서대학교 공업기술연구소 2000 工業技術硏究所論文集 Vol.19 No.-

in this Paper, we developed the DC parameter system which inspects the property of DC parameter for semiconductor products. The conventional system has complex hardware. Also the interfacing with IBM-PC is hard because that was almost materialized by analogy circuits. The proposed system is interfaced by IBM-PC. It is consisted of CPLD (Complex Programmable Logic Device) part, ADC (Analogue to Digital Converter), DAC (Digital to Analogue Converter), voltage/current source, variable resistor and measurement part. In the proposed system, we have designed the constant voltage source and the constant current source in a part. The CPLD part is designed by VHDL (VHSIC Hardware Description Language), which it generates the control and converts the serial data to parallel data. Voltage source part generates analogue test voltage and maintains that one. Current source part generates the analogue test current and maintains the current. ADC part converts analogue data to 16 bits digital data. DAC part converts the 12 bits digital test voltage to analogue voltage. Variable resistor is the part far the controlling the range of current. The proposed DC parameter test system has two test channels and it operates VFCS (Voltage Force Current Sensing) mode and CFVS (Current Force Voltage Sensing) mode. The normal resistor with error range ±5% and diode is tested. When the normal resistor testing about 10% error is measured. When the diode testing about 7% error is measured.

Module tester 하드웨어 개발

김준식 호서대학교반도체제조장비국산화 연구센터 2000 반도체 장비기술 논문집 Vol.2000 No.-

국내에서 생산되는 반도체의 주를 이루고 있는 메모리 소자는 한국을 대표하는 수출업종이 되었다. 이렇게 급변하는 반도체 제조 기술에 비해 검사장비 및 검사장비 개발은 국내 기술로는 아직 부족한 면이 많다. 특히 반도체 검사 장비 중 반드시 거쳐야 하는 DC parameter tester 에 관한 국내 기술 자료는 거의 없는 형편이다. 이에 본 연구개발에서는 제조된 반도체 소자를 제조공정중 혹은 불량 검사 시에 사용할 수 있는 DC parameter tester를 구현하였다. 기존에 제작된 검사 시스템에서는 여러 보상 회로 및 출력 안정회로, 고전압 검사 회로 등이 포함되어 회로가 복잡하고, PC와의 인터페이스 또한 어려웠으나, 본 연구에서는 적은 개수의 반도체 소자를 사용하여 DC parameter tester 를 구현하였으며, Altera EPM7064SLC44-10를 사용하여 아날로그 회로와 PC와의 인터페이스를 쉽게 구현하였다. 또한 동작의 안정성을 위하여 출력값을 입력값과 비교하여 그 차이를 다시 입력값과 더하거나 빼주어 출력을 안정시키는 방법을 사용하였다. 다이오드 1N4148에 대해서 VFCS(Voltage Force Current Sensing)와 CFVS (Current Force Voltage Sensing)모드로 검사하여 컴퓨터 모의실험 결과와 비교하였으며, 이를 통해 본 연구에서 개발한 겸사 시스템의 성능을 입증하였다.

등고선 지도에서의 등고선 복원/인식에 관한 연구

金俊植,金基順,金海正 湖西大學校工業技術硏究所 1999 工業技術硏究所論文集 Vol.18 No.-

In this paper, we proposed the algorithm which extracts the contour lines in the contour map and reconstructs the broken ones. The contour lines is extracted by the algorithm using fairing method. Then the broken lines by symbols and the height number datum are reconstructed by using the Bezier polynomial function. In the reconstruction process, the control points which is searched by tracking the extracted contour lines are used. The reconstruction results is affected by the selection of the control points. The best selection is the choosing respectively the position of 6/10 between starting point and the cross point and between ending point and the cross one. The proposed algorithm has solved the problems with the conventional method by the division of the processing steps between the main contour lines and others. In the simulation results, the proposed method can be used in the digital elevation map generation. Also because the proposed one is consist of the automatic processing step, all the results can be obtained by the processing of computer.

PCB 검사를 위한 비젼 시스템 개발

김기순,김준식 湖西大學校 工業技術硏究所 2002 工業技術硏究所論文集 Vol.21 No.-

In this paper, we proposed the vision system that inspects automatically missing/wrong insertion of electronic components and the scratch filth on the end product of PCB. The system consists of the software part that inspects PCB products and the hardware part to control XY-table and CCD camera. The hardware part controls the XY-table to import the product images through the CCD cameras. The imported image are inspected by software part. The front side image of product is acquired by 1 times image and back side images are acquired by 4 times image. After the preprocessing through the noise removing and inspection area extraction, the inspection for front and back side components is done. In the inspection processes, we respectively use the features of electronic components, In the simulation, the proposed system has a good performance.

USB 카메라를 이용한 이동물체 실시간 추적 알고리즘

김윤수,김준식 湖西大學校 工業技術硏究所 2002 工業技術硏究所論文集 Vol.21 No.-

In security system, moving image is usually used. To do that, the skill of tracking for moving change is needed. Generally, the conventional methods store moving images continuously in the storage media, therefore the disadvantage of conventional method has a high price. In this paper, we propose an algorithm for moving object tracking using USB camera, Which can use a security system. The real-time moving object tracking algorithm using USB camera is able to reduce the price and easy to apply in security system. This paper is studied on the real-time moving object tracking algorithm using USB camera. The input image are separated a background and an object using difference method. After difference image have a noise. For remove this noise, on this study using median filtering. In the next step, the segmented object region is processed by center of gravity method. Therefor, the coordinates of center of gravity for the extracted moving region is obtain. In the simulation results, the performance of proposed algorithm is verified, also the proposed one has good performance.

PLD 소자를 이용한 programmable delay 회로 설계

노영동,김준식 湖西大學校工業技術硏究所 2003 工業技術硏究所論文集 Vol.22 No.-

In the signal progresses, time delay can happen, and bring the operation error by the delay. Digital signal sets the timing to clock signal that get into ordinary standard. The delay of signal can bring the operational fatal error by that high speed digital system achieves CPU, RAM, ROM, FPGA and interface ICS and organic action fast usually. Skew can happen by such delayed signals and the serious problem in signal progresses can be happened on the semiconductor device testing or other digital circuit operating by the skew. To solve these problems, the device that make the exact delay must be used. To make a exact delay can be done by using delay components. However, many delay components must be used in the circuit design for complex delay structure. In this paper, we propose the programmable delay method/circuit using PLD device. The proposed method has many advantages, because that uses interior gates of PLD device from 1㎱ to several ㎱ delay the circuit designer can do programming voluntarily, and prove precision.

마이크로파 여기 플라즈마광 생성을 위한 도파관 시스템 설계에 관한 연구

전상재,전후동,송창현,하석영,이승혁,이태호,박의준 금오공과대학교 2005 論文集 Vol.26 No.-

In this paper, the plasma lighting system(PLS) excited by the commercial high power magnetron is developed. The design concepts are based on maximizing the huninous efficacy in conjunction with the miniaturization of waveguide system Furthermore the fine tuning is simplified by using only one stub, and the impedance matching is maximized by introducing the tapering technique. The experimental results show that the luminous efficacy can be dramatically improved by the proposed design method.

반도체소자의 고속마킹검사를 위한 vision system 개발

노영동,주효남,김주식 湖西大學校 工業技術硏究所 2005 工業技術硏究所論文集 Vol.24 No.-

In this paper, we propose the high speed making/surface inspection algorithm, that use adaptive automatic acquisition algorithm and real time matching algorithm of model data. The proposed automatic acquisition algorithm to obtain the adaptive model data extracts the interesting regions to fit in semiconductor characteristics, and create models of several semiconductor regardless of position and type. The proposed teal time matching algorithm uses geometrical pattern matching method to minimize effect of external environment of making/surface and only use semiconductor characteristic information. The proposed system has faster processing time than the conventional method. Also the proposed one has a good performance.

FPD 결함검사를 위한 Vision Inspection System 설계에 관한 연구

박성재,김민수,김준식,주효남 湖西大學校 工業技術硏究所 2005 工業技術硏究所論文集 Vol.24 No.-

A system is designed and developed to acquire accurate images and to detect cell defects of Flat Panel Displays. Detailed analysis and experiments are performed to design and select the lighting, optical and camera sub-system as well as mechanical motion and position control sub-system. Sample images are acquired using the developed system and the processed result shows the good performance in detecting simple cell defects.

ABSTRACTS ; Posters : MIMETIC PEPTIDES OF CONFORMATIONAL AND LINEAR EPITOPES AGAINST ANTI - OVALBUMIN ANTIBODY

Joon Sung Hwang,Yang Min Lee,Kang Seek Park,Myung Bohm Kim,Ho Shik Won,Hyo Joon Kim 생화학분자생물학회(구 한국생화학분자생물학회) 1995 추계학술대회집 Vol.- No.-