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Yong, Ho,Na, Sekwon,Gang, Jun-Gu,Shin, HaeSun,Jeon, Seong-Jae,Hyun, SeungMin,Lee, Hoo-Jeong Institute of Pure and Applied Physics 2016 Japanese Journal of Applied Physics Vol.55 No.6
<P>In this study, we explore various electrode materials (Au, Ti, and Sb) for use as contact materials on Bi2Te3 and Sb2Te3 thermoelectric films. Using the transmission line method (TLM), we measured the specific resistivity of the contacts, which showed that Au has the lowest contact resistivity for both the thermoelectric films (after annealing): 2.7 x 10(-10)Omega m(2) for Bi2Te3 and 2.9 x 10(-11)Omega m(2) for Sb2Te3. The specific contact resistivity data suggest that the dominant factor for the contact properties is interface states. After annealing, the contact resistivity does not change much for the Bi2Te3 contacts while it drops greatly for the Sb2Te3 ones. Analysis of the carrier transport mechanism across the contacts discloses that changes in the carrier concentration in the thermoelectric films after annealing are responsible for the different behaviors. (C) 2016 The Japan Society of Applied Physics</P>