http://chineseinput.net/에서 pinyin(병음)방식으로 중국어를 변환할 수 있습니다.
변환된 중국어를 복사하여 사용하시면 됩니다.
The Role of Gut Microbiota and Genetic Susceptibility in the Pathogenesis of Pancreatitis
Xu Fumin,Yang Chunmei,Tang Mingcheng,Wang Ming,Cheng Zhenhao,Chen Dongfeng,Chen Xiao,Liu Kaijun 거트앤리버 소화기연관학회협의회 2022 Gut and Liver Vol.16 No.5
Pancreatitis is one of the most common inflammatory diseases of the pancreas caused by autodigestion induced by excessive premature protease activation. However, recognition of novel pathophysiological mechanisms remains a still challenge. Both genetic and environmental factors contribute to the pathogenesis of pancreatitis, and the gut microbiota is a potential source of an environmental effect. In recent years, several new frontiers in gut microbiota and genetic risk assessment research have emerged and improved the understanding of the disease. These investigations showed that the disease progression of pancreatitis could be regulated by the gut microbiome, either through a translocation influence or in a host immune response manner. Meanwhile, the onset of the disease is also associated with the heritage of a pathogenic mutation, and the disease progression could be modified by genetic risk factors. In this review, we focused on the recent advances in the role of gut microbiota in the pathogenesis of pancreatitis, and the genetic susceptibility in pancreatitis.
An Improved Algorithm of Rough K-Means Clustering Based on Variable Weighted Distance Measure
Tengfei Zhang,Long Chen,Fumin Ma 보안공학연구지원센터 2014 International Journal of Database Theory and Appli Vol.7 No.6
Rough K-means algorithm has shown that it can provides a reasonable set of lower and upper bounds for a given dataset. With the conceptions of the lower and upper approximate sets, rough k-means clustering and its emerging derivatives become valid algorithms in vague information clustering. However, the most available algorithms ignore the difference of the distances between data objects and cluster centers when computing new mean for each cluster. To solve this issue, an improved algorithm of rough k-means clustering based on variable weighted distance measure is presented in this article. Comparative experimental results of real world data from UCI demonstrate the validity of the proposed algorithm.
Yanjun Lu,Jiajing Sun,Xiaoyu Wu,Fumin Chen 한국정밀공학회 2023 International Journal of Precision Engineering and Vol.10 No.2
The electrical discharge is able to realize efficient dressing for metal-bonded diamond wheel, but the monitoring and prediction of dressing status have been technical bottleneck in industrialization. Hence, the metal bond removal model of impulse spark and arc discharges is proposed to realize on-line monitoring and prediction for micro grain protrusion on diamond grinding wheel surface. The relationship between microremovals of metal bond and impulse spark and arc discharge parameters was investigated for controllable dressing. First, the static and dynamic impulse discharge experiments were carried out to reveal metal bond removal mechanisms of impulse spark and arc discharges; then the relationship between characterized impulse discharge parameters and removal of metal bond was quantitatively analyzed; finally, the dry electro-contact discharge (ECD) dressed coarse diamond wheels were applied to perform smooth surface and mirror grinding of optical glass and mold steels against mechanical dressed wheels. It is found that the critical transition value of arc discharge to spark discharge under static discharge and dynamic discharge conditions were 0.059 and 0.038, respectively. In comparison with mechanical dressing, the dry ECD can obtain higher grain protrusion height to improve ground surface quality, leading to a microscopic smooth surface of BAK3 optical glass and macroscopic mirror-like surface of model steels. It is confirmed that the established relationship model can be effectively used to on-line predict the removal of metal bond with the average prediction error of 10.1% and microscopic grain protrusion by characterized impulse discharge parameters.