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다적층 세라믹 커패시터의 정확한 임피던스 측정을 위한 테스트 픽스쳐의 패드와 비아홀 효과 디임베딩 방법
이상욱(Sanguk Lee),김현웅(Hyunwoong Kim),안장용(Jangyong Ahn),김홍석(Hongseok Kim),안승영(Seungyoung Ahn) 대한전자공학회 2023 대한전자공학회 학술대회 Vol.2023 No.6
In this paper, we propose a method for de-embedding the parasitic elements of the pad and via-hole in the test fixture for accurate impedance measurement of multi-layer ceramic capacitor(MLCC). Since MLCC is measure measured mounted on the test fixture, the parasitic effect of the test fixture should be eliminated from the measurement result. The existing de-embedding methods can de-embed the access line of the test fixture, but the effects of pads and via-holes using open and short fixtures. In this paper, the impedance of short bar and MLCC are extracted through simulation and measurements and compared and analyzed with the 2x thru de-embedding method. In addition, the effects of the error due to the parasitic components of the MLCC on the system are analyzed based on the power distribution network analysis.