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깁병철,박세현,이행세,김영길 亞洲大學校 1986 論文集 Vol.9 No.-
In this paper, a new focusing method, to be called the sampled delay focusing (SDF), is proposed to improve the B-scan lateral resolution. In SDF, sampling sum process can replace the conventional delay sum sampling process, and thus the analog delay lines are no longer necessary. This method offers continuous dynamic focusing on the resolution pixel basis if the maximum delay time is less than the sampling interval. Second order sampling is adopted in order to extend the sampling interval.