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HVAC용 룸 유니트 (Room Unit)의 소음저감성능해석
김상렬,김현실,이성현,김봉기,김재승 대한조선학회 2012 대한조선학회 학술대회자료집 Vol.2012 No.5
In this paper, acoustic performance of the large-sized room units for ship HVAC system is studied. The room unit consists of a rectangular chamber of which inside partitions are covered by absorptive material with fabric skin. The room unit has one inlet and three outlets. At the inlet, a plane damper is installed to control the flow rate. The acoustic performance of a prototype room unit is measured using a HVAC mock-up. It is shown that insertion loss is comparable with that of a commercial room unit, although the prototype generates more flow noise than the commercial product. The major source of flow noise is analyzed by NADS-R, the noise analysis program for room unit. In order to reduce the flow noise, cone-shaped dampers are inserted into the room unit. It is shown that the cone-shaped damper decreases flow noise remarkably.
최재욱,김상렬 東亞大學校 大學院 1993 大學院論文集 Vol.18 No.-
The characteristics of critical spontaneous ignition of granulated activated carbon were investigated at a constant ambient temperature and sinusoidally varying ambient temperatures. As the results of the experiments, the critical spontaneous ignition temperature at the sinusoidally varying ambient tem-peratures was generally lower than that at the constant ambient temperature. At the critical spontaneous ignition temperature decreased as the period increased. The critical Frank-Kameneskii's parameter δ?(εω) was determinded from the results. δ?(εω) = δ?{1-379 exp (-0.935·ω?)} δ?(εω) = δ?{1-381 exp (-0.930·ω?)} δ?(εω) = δ?{1-388 exp (-0.929·ω?)}
김상렬,김두현,강동규 한국산업안전학회 2002 한국안전학회지 Vol.17 No.4
As the use of automatic handling equipment for sensitive semiconductor devices is rapidly increased, manufacturers of electronic components and equipments need to be more alert to the problem of electrostatic discharges(ESD). In order to analyze damage characteristics of semiconductor device damaged by ESD, this study adopts a new charged-device model(CDM), field-induced charged model(FCDM) simulator that is suitable for rapid, routine testing of semiconductor devices and provides a fast and inexpensive test that faithfully represents ESD hazards in plants. High voltage applied to the device under test is raised by the field of non-contacting electrodes in the FCDM simulator, which avoids premature device stressing and permits a faster test cycle. Discharge current and time are measured and calculated. The characteristics of electrostatic attenuation of domestic semiconductor devices are investigated to evaluate the ESD phenomena in the semiconductors. Also, the field charging mechanism, the device thresholds and failure modes are investigated and analyzed. The damaged devices obtained in the simulator are analyzed and evaluated by SEM. The results obtained in this paper can be used to prevent semiconductor devices from ESD hazards and be a foundation of research area and industry relevant to ESD phenomena.