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Spectroscopic ellipsometry study of Ir(ppy)3 organic light emitting diode
Nataliya Nabatova-Gabain,Yoko Wasai,Taiju Tsuboi 한국물리학회 2006 Current Applied Physics Vol.6 No.5
We studied the optical properties offactris(2-phenylpyridine) iridium (Ir(ppy)3) emitting layer in single-layer organic light emit-ting diode (OLED) device and in thin lm grown on quartz plate using a phase modulated spectroscopic ellipsometry (PMSE).Accurate spectra of refractive indexn and extinction coecientk of Ir(ppy)3 were obtained in the wavelength range of 330830 nm in the device and lm. Dierence was observed in then and k spectra between the single layer thin lm evaporated on quartzplate and OLED. Additionally dierence was found between the layer thickness estimated by quartz oscillator and thickness esti-mated from the PMSE measurement.