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오늘 본 자료
Passivation Layer of CdZnTe as Studied by Spectroscopic Ellipsometry
Jianyong Teng,Wenbin Sang,Yue Lu,Yanyan Lou,Jiahua Min,Xiaoyan Liang,Kaifeng Qin,Yongbiao Qian 한국물리학회 2008 THE JOURNAL OF THE KOREAN PHYSICAL SOCIETY Vol.53 No.5
An oxidized layer was obtained on a cadmium zinc telluride (CZT) wafer by using chemical etching first in a KOH-KCl solution and then in an NH4F/H2O2 solution. The oxidized layer on the CZT obtained by using this method was analyzed by using ex-situ spectroscopic ellipsometry (SE) for the first time. In particular, the optical constants and the thickness of the chemical oxidized layer were obtained as functions of the oxidizing time.