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Linearly Polarized Emission of Quantum Wells Subject to an In-Plane Magnetic Field
D. Wolverson,Yu. G. Kusrayev,A. V. Koudinov,N. S. Averkiev,J. J. Davies,J. Kossut,G. Karczewski,T. Wojtowicz 한국물리학회 2008 THE JOURNAL OF THE KOREAN PHYSICAL SOCIETY Vol.53 No.5
We present results on the linear polarization of the photoluminescence (PL) of dilute magnetic semiconductor quantum wells which is induced by an applied magnetic field. The PL is found to be partially linearly polarized, but without any correlation with the polarization of the exciting light, whilst the direction of the polarization does not depend on the direction of the magnetic field in the plane although its magnitude does. We present a model for this behavior in terms of a possible reduction of the in-plane symmetry of the quantum well; we conclude that any perturbations giving (i) a finite in-plane hole g-factor and (ii) a mixing of light and heavy holes are sufficient to generate the type of experimental behavior we observe.
김태중,Young Dong Kim,J Kossut 한국물리학회 2006 THE JOURNAL OF THE KOREAN PHYSICAL SOCIETY Vol.49 No.3
We investigate the pseudodielectric functions h"i of Cd1¡xMgxTe ternary alloy .lms of composi- tions x = 0.00, 0.23, 0.31, and 0.43 by using vacuum ultraviolet spectroscopic ellipsometry (SE) in the spectral range from 0.7 to 9.0 eV at room temperature. We observed three new critical point energies in the spectral range from 5.5 to 8 eV whose observation by using SE had not been pre- viously reported. Based on a reported band structure calculation, we interpreted that these three peaks as ¢v 5 ¡¢c 5, Lv 4;5¡Lc 6, and Lv 6 ¡Lc 4;5 transitions. The values of the three critical point energies and their x dependences were determined from numerically calculated second energy derivatives of the data.&
Dielectric Functions of Cd1-xMgxTe Alloy Films by Spectroscopic Ellipsometry
Y. D. Kim*,D. E. Aspnes,J. Kossut,T. J. Kim,Y. S. Ihn,Y. S. Ihn 한국물리학회 2003 THE JOURNAL OF THE KOREAN PHYSICAL SOCIETY Vol.43 No.42
We report spectroscopic ellipsometric (SE) measurements of the above-bandgap optical properties of Cd$_{1-x}$Mg$_x$Te ternary alloy films, for $x$ = 0.00, 0.23, 0.31, and 0.43, grown on GaAs substrates. Using chemical treatments to remove overlayers, we obtain the closest approximations to the bulk dielectric functions $\varepsilon$ of these materials to date. The present work updates our previous report [Appl. Phys. Lett. \textbf{71}, 249 (1997)], in which the data showed nonzero $\langle\varepsilon_2\rangle$ values below the fundamental absorption edge.