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Prediction of Parental Combination for Introduction of Stay-Green Associated Loci in Wheat
Henrique de Souza Luche, Jose Antonio Gonzalez da Silva, Rafael Nornbe 한국작물학회 2017 Journal of crop science and biotechnology Vol.20 No.2
In wheat, the increase of yield and stability associated traits can be achieved by combining parents containing the stay-green trait and favorable alleles for grain yield. The aim of this work was to analyze the genetic dissimilarity between wheat lines from stay-green and synchronized maturation groups and elite cultivars. Moreover, to propose promising combinations seeking the selection of high-grain yield and high bread-making quality genotypes containing stay-green trait. The experiment was conducted in a randomized block design with three replications in 2003, 2004, and 2005, using sister-lines with the presence and absence of stay-green trait and elite cultivars. Genetic variability exists among wheat strains from the synchronized stay-green maturation group and elite cultivars. Genotypes of maturation group stay-green obtained an average performance superior to the synchronized group. Crosses between stay-green lines and the CEP 29 and BRS 177 cultivars are promising in the selection of genotypes carrying the stay-green trait with high yield and bread-making quality