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RISS 인기검색어
- 검색키워드
- 저자 : Fuping Zeng (검색결과 4 건)
- 무료
- 기관 내 무료
- 유료
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Fuping Zeng,Jing Luo,Ju Tang,Qian Zhou,Qiang Yao 대한전기학회 2017 Journal of Electrical Engineering & Technology Vol.12 No.1
SF6 decomposition products can be used to detect partial discharge (PD), but the metal materials in a PD area can significantly affect SF6 decomposition characteristics. Disregarding the effect of metal materials on such characteristics inevitably result in certain errors when using them to diagnose the internal insulation faults of gas-insulated switchgears. This paper investigates the influence regularity on the main stable decomposition components of SF6 (namely SO₂F₂ and SOF₂) of the commonly metal materials uesd in GIS, such as aluminum (Al), copper (Cu) and stainless steel (SS). Firstly, an experimental platform is constructed to simulate SF6 decomposition under a PD area, and the influence regularities of Al, Cu and SS on the concentration, formation rate and saturation time of SO₂F₂ and SOF₂ are obtained. Secondly, the influence mechanism of Al, Cu and SS are preliminary explored combined with the chemical activity of the metal materials.
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Zeng, Fuping,Luo, Jing,Tang, Ju,Zhou, Qian,Yao, Qiang The Korean Institute of Electrical Engineers 2017 Journal of Electrical Engineering & Technology Vol.12 No.1
$SF_6$ decomposition products can be used to detect partial discharge (PD), but the metal materials in a PD area can significantly affect $SF_6$ decomposition characteristics. Disregarding the effect of metal materials on such characteristics inevitably result in certain errors when using them to diagnose the internal insulation faults of gas-insulated switchgears. This paper investigates the influence regularity on the main stable decomposition components of $SF_6$ (namely $SO_2F_2$ and $SOF_2$) of the commonly metal materials uesd in GIS, such as aluminum (Al), copper (Cu) and stainless steel (SS). Firstly, an experimental platform is constructed to simulate $SF_6$ decomposition under a PD area, and the influence regularities of Al, Cu and SS on the concentration, formation rate and saturation time of $SO_2F_2$ and $SOF_2$ are obtained. Secondly, the influence mechanism of Al, Cu and SS are preliminary explored combined with the chemical activity of the metal materials.
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Zeng, Fuping,Tang, Ju,Xie, Yanbin,Zhou, Qian,Zhang, Chaohai The Korean Institute of Electrical Engineers 2015 Journal of Electrical Engineering & Technology Vol.10 No.4
It is common practice to identify the insulation faults of GIS through monitor the contents of SF<sub>6</sub> decomposed components. Partial discharges (PD) could lead to the decomposition of SF<sub>6</sub> dielectric, so new reactions usually occur in the mixture of the newly decomposed components including traces of H<sub>2</sub>O and O<sub>2</sub>. The new reactions also cause the decomposed components to differ due to the different amounts of H<sub>2</sub>O and O<sub>2</sub> even under the same strength of PD. Thus, the accuracy of assessing the insulation faults is definitely influenced when using the concentration and corresponding change of decomposed components. In the present research, a needle-plate electrode was employed to simulate the PD event of a metal protrusion insulation fault for two main characteristic components SO<sub>2</sub>F<sub>2</sub> and SOF<sub>2</sub>, and to carry out influence analysis of trace H<sub>2</sub>O and O<sub>2</sub> on the characteristic components. The research shows that trace H<sub>2</sub>O has the capability of catching an F atom, which inhibits low-sulfide SF<sub>x</sub> from recombining into high-sulfide SF<sub>6</sub>. Thus, the amount of SOF<sub>2</sub> strongly correlates to the amount of trace H<sub>2</sub>O, whereas the amount of SO<sub>2</sub>F<sub>2</sub> is weakly related to trace H<sub>2</sub>O. Furthermore, the dilution effect of trace O<sub>2</sub> on SOF<sub>2</sub> obviously exceeds that of SO<sub>2</sub>F<sub>2</sub>.
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Fuping Zeng,Ju Tang,Yanbin Xie,Qian Zhou,Chaohai Zhang 대한전기학회 2015 Journal of Electrical Engineering & Technology Vol.10 No.4
It is common practice to identify the insulation faults of GIS through monitor the contents of SF6 decomposed components. Partial discharges (PD) could lead to the decomposition of SF6 dielectric, so new reactions usually occur in the mixture of the newly decomposed components including traces of H₂O and O₂. The new reactions also cause the decomposed components to differ due to the different amounts of H₂O and O₂ even under the same strength of PD. Thus, the accuracy of assessing the insulation faults is definitely influenced when using the concentration and corresponding change of decomposed components. In the present research, a needle-plate electrode was employed to simulate the PD event of a metal protrusion insulation fault for two main characteristic components SO₂F₂ and SOF₂, and to carry out influence analysis of trace H₂O and O₂ on the characteristic components. The research shows that trace H₂O has the capability of catching an F atom, which inhibits low-sulfide SFx from recombining into high-sulfide SF6. Thus, the amount of SOF₂ strongly correlates to the amount of trace H₂O, whereas the amount of SO₂F₂ is weakly related to trace H₂O. Furthermore, the dilution effect of trace O₂ on SOF₂ obviously exceeds that of SO₂F₂.
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