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태양광 발전시스템의 신뢰성 향상을 위한 태양전지의 PID 저감 기술의 타당성 검토
백성선(Sungsun Baik),백승엽(Seungyup Baek),정태욱(Tae-Wook Jung),조진형(Jin-Hyng, Cho) 한국산업경영시스템학회 2013 한국산업경영시스템학회지 Vol.36 No.2
In recent years, anti-PID (Potential Induced Degradation) technologies have been studied and developed at various stages throughout the solar value chain from solar cells to systems in an effort to enhance long-term reliability of the photovoltaics (PV) system. Such technologies and applications must bring in profits economically for both manufacturers of solar cell/module and investors of PV systems, simultaneously for the development of the PV industry. In this study two selected anti-PID technologies, ES (modification of emitter structure) and ARC (modification of anti-reflective coating) were compared based on the economic features of both a cell maker with 60MW production capacity and an investor of 1MW PV power plant. As a result of this study, it is shown that ARC anti-PID technology can ensure more profits over ES technology for both the cell manufacturer and the investor of PV power plant.