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백준,조형철,강무현,장민희 대한이비인후과학회 2005 대한이비인후과학회지 두경부외과학 Vol.48 No.11
Background and objectives:Otitis media is one of the most common inflammatory disorders in the field of otolaryngology. Fortunately, with development in antibiotics and advances in preventive therapy otitis media is on the decrease. Nevertheless, there are only few reports about the prevalence rate of otitis media in Korea. Therefore, we investigated the prevalence of each type of otitis media among young adults in Gwangju and the Province of Chonnam, Korea. Subjects and Method:28,200 men aged 19 years old who underwent physical examination for conscription at the Military Manpower Administration in Gwangju from February to september, 2002 were analyzed, retrospectively. Results:The overall prevalence of otitis media was 0.219%. Prevalence of each subtype was as follows;acute otitis media, 0%;otitis media with effusion, 0.049%;chronic otitis media, 0.17%, respectively. In the group of chronic otitis media, chronic perforated otitis media was 95.8%. The prevalence of otitis media did not vary by urban - rural difference, nor by coastal - inland area. Conclusion:The prevalence rate of chronic otitis media was remarkably decreased, compared with 10 years ago (0.70%), and conspicuously with 20 years ago (2.81%). Therefore, we think this low prevalence rate is partially due to remarkable improvement in socioeconomic conditions with better nutrition, housing, hygienic condition, social environments and advances in public health and medical care.
李在旼,白濬 관동대학교 1995 關大論文集 Vol.23 No.1
This paper proposes a new test generation technique for the stuck-open faults in the CMOS circuits using Hopfield networks. In the proposed technique, the stuck-open faults of CMOS circutis are replaced by the stuck-at faults of the gate-level CMOS circuits composed of the neural networks and the test sequences can be generated from gate-level CMOS circuits. The CUT(Circuit Under Test) is compiled to an ATPG(Automatic Test Patten Generation) neural network and the specific activation values are set to the neurons corresponding to the signal lines in the circuits for fault injection and the connections between some gate modules are invalidated to disconnect the inverse activation paths. A test patten for an injected fault is obtained when all gate modules in the ATPG neural network are stabilized through evolution and mutual interactions. The proposed technique is implemented by the Clanguage and the efficiency of algorithm is confirmed by some examples.