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Harutyun Melikyan,Tigran Sargsyan,Arsen Babajanyan,Seungwan Kim,Jongchel Kim,이기진 한국물리학회 2009 THE JOURNAL OF THE KOREAN PHYSICAL SOCIETY Vol.55 No.1
A near-field scanning microwave microscope (NSMM) system incorporating an atomic force microscope (AFM) cantilever probe tip was used for the direct imaging of magnetic domains The NSMM images of domain were obtained by measuring the microwave reflection coefficient S11 at an operating frequency near 4.1 GHz and were compared with the magnetic force microscope (MFM) image. The AFM cantilever probe tip with the NSMM coupled to the tuning fork distance control system provided nano-spatial resolution. The NSMM incorporating an AFM tip offers a reliable means for quantitatively measuring of magnetic domains with nano-scale resolution and high sensitivity. A near-field scanning microwave microscope (NSMM) system incorporating an atomic force microscope (AFM) cantilever probe tip was used for the direct imaging of magnetic domains The NSMM images of domain were obtained by measuring the microwave reflection coefficient S11 at an operating frequency near 4.1 GHz and were compared with the magnetic force microscope (MFM) image. The AFM cantilever probe tip with the NSMM coupled to the tuning fork distance control system provided nano-spatial resolution. The NSMM incorporating an AFM tip offers a reliable means for quantitatively measuring of magnetic domains with nano-scale resolution and high sensitivity.
Investigation of the Photovoltaic Effect in Solar Cells by Using a Near-field Microwave Microscope
Arsen Babajanyan,Tigran Sargsyan,Harutyun Melikyan,Seungwan Kim,Jongchel Kim,이기진 한국물리학회 2009 THE JOURNAL OF THE KOREAN PHYSICAL SOCIETY Vol.55 No.1
A near-field microwave microscope (NFMM) technique has been used to investigate the photovoltaic effect in solar cells. By measuring the reflection coefficient S11 at an operating frequency near 4.1 GHz, we could observe the photoconductivity changes inside the solar cells. The photoconductivity of the n-type silicon layer in a solar cell increased as the incident light’s intensity was increased due to the carrier motion through the pn junction. The photoconductivity also varied with the incident light’s wavelength. We found good agreement between the variations in the microwave reflection coefficient S11 and the IV characteristics of solar cells for different incidentlight intensities and wavelengths. A near-field microwave microscope (NFMM) technique has been used to investigate the photovoltaic effect in solar cells. By measuring the reflection coefficient S11 at an operating frequency near 4.1 GHz, we could observe the photoconductivity changes inside the solar cells. The photoconductivity of the n-type silicon layer in a solar cell increased as the incident light’s intensity was increased due to the carrier motion through the pn junction. The photoconductivity also varied with the incident light’s wavelength. We found good agreement between the variations in the microwave reflection coefficient S11 and the IV characteristics of solar cells for different incidentlight intensities and wavelengths.
Investigation of CdS Films Prepared by Using Chemical Bath Deposition
이기진,알센바바쟈얀,Tigran Sargsyan,차덕준 한국물리학회 2008 THE JOURNAL OF THE KOREAN PHYSICAL SOCIETY Vol.53 No.2
Cadmium-sulphide (CdS) films were prepared on glass substrates by using a chemical bath deposition method. The dependences of the microstructures and the morphologies of CdS films on the annealing temperatures were investigated by using X-ray diffraction, scanning electron microscopy and atomic force microscopy. The change in the sheet resistance due to dierent annealing temperatures was studied by using a near-eld microwave microprobe by measuring the reflection coefficient S11. As the annealing temperature increased from room temperature to 300 ℃, the sheet resistance of the CdS films decreased, the surface roughness and grain size decreased and the surface showed a smoother morphology.