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Stacking fault density and bond orientational order of fcc ruthenium nanoparticles
Seo, Okkyun,Sakata, Osami,Kim, Jae Myung,Hiroi, Satoshi,Song, Chulho,Kumara, Loku Singgappulige Rosantha,Ohara, Koji,Dekura, Shun,Kusada, Kohei,Kobayashi, Hirokazu,Kitagawa, Hiroshi American Institute of Physics 2017 Applied Physics Letters Vol.111 No.25
Seiji Nakashima,Hironori Fujisawa,Masaru Shimizu,Osami Sakata,Tomoaki Yamada,Hiroshi Funakubo,박정민,Takeshi Kanashima,Masanori Okuyama 한국물리학회 2011 THE JOURNAL OF THE KOREAN PHYSICAL SOCIETY Vol.59 No.31
An electric-field-induced strain at 80 K in a 350-nm-thick BiFeO_3 (BFO) thin film deposited by pulsed laser deposition has been investigated by a time-resolved x-ray diffraction under an electric field using a synchrotron radiation. A 300-nsec-width and 804.09-nsec-period voltage pulses were applied to the BFO thin film during the measurements. The time-resolved-x-ray diffraction profile around BFO (001) diffraction peak indicates that BFO (001) diffraction peak shifts to lower angle side during the voltage application. A strain estimated from the peak shift lineally increases with increasing the amplitude of the voltage pulses. A piezoelectric constant (d_(33)) of (001)-oriented domains in the polycrystalline BFO thin film at 80 K is 20.2 pm/V. The value is smaller than that measured at RT of 27.8 pm/V in our previous report.
Temperature Dependent Octahedral Tilting Behaviors of Monoclinic and Tetragonal SrRuO3 Thin Films
이성수,서옥균,Jaemyung Kim,Chulho Song,Satoshi Hiroi,Yanna Chen,Yoshio Katsuya,Osami Sakata 한국물리학회 2018 THE JOURNAL OF THE KOREAN PHYSICAL SOCIETY Vol.73 No.10
We used in-situ synchrotron X-ray scattering to investigate phase transformations of octahedral tilted monoclinic SrRuO3 (MSRO) and tetragonal SRO (TSRO) thin films on SrTiO3 (STO) substrates. The octahedral tilted MSRO thin films were highly crystalline and the monoclinic distortion angle was 0.45. The phase transition temperature from the MSRO to TSRO phase occurred at approximately 200 C as a second order transition. Conversely, no phase transformations of the TSRO thin film occurred within the range from RT to 250 C. The octahedral RuO6 rotation was strongly affected by the phase transformation in the SRO thin films.