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Design and Fabrication of a Low-Cost Teaching Atomic Force Microscope with 3D Printed Parts
Melody CHEPKOECH,Bernard Ouma Alunda,루크오두어르오티에노,박상준,Clare Chisu Byeon,이영중 한국물리학회 2019 새물리 Vol.69 No.2
Over the past decade, additive manufacturing and three-dimensional (3D) printing have had a profound impact on manufacturing. With the emergence of affordable 3D printers, rapid prototyping has been quite accessible to researchers in academic and industrial laboratories. As a consequence, the number of laboratory instruments that have been assembled with 3D printed parts has risen. We present an atomic force microscope (AFM) constructed with as many 3D printed parts as the design would permit. Due to its simplicity, the proposed AFM is suitable for assembly by undergraduate students in a project-based laboratory course setting. The images of compact disc (CD) data tracks and standard samples obtained using the proposed low-cost AFM effectively demonstrate its nanoscale imaging capability.
Bernard Ouma Alunda,루크오두어르오티에노,Melody CHEPKOECH,변지수,이영중 한국물리학회 2019 THE JOURNAL OF THE KOREAN PHYSICAL SOCIETY Vol.74 No.2
The optical beam de ection sensor remains the most popular force detection method used in atomic force microscopy. With the recent development of short cantilevers, a means for measuring small de ections at high frequencies has become a challenge. Minimizing the noise level of the readout electronics without signicantly limiting the detection bandwidth still remains a challenge. In this work, a recently proposed trans-linear readout circuit-based technique, in which necessary analog arithmetics are done in the current domain instead of the voltage domain, is compared to a more traditional trans-impedance readout circuit-based topology. Our developed trans-impedance readout circuit recorded a noise oor of 9:48 1013 V2 Hz1 compared to 1:41 1011 V2 Hz1 for the trans-linear readout circuit. Also, the measured 3 dB bandwidth of 11 MHz for the transimpedance readout circuit was slightly higher than the 10 MHz for the trans-linear readout circuit. Trans-impedance readout circuits, with proper circuit design considerations and careful selection of electronic parts, still remain competitive for use in high-speed operations in atomic force microscopy.