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Cheng-Tai Kuo,Karuppannan Balamurugan,Hung Wei Shiu,Hyun Ju Park,Soobin Sinn,Michael Neumann,한문섭,장영준,Chia-Hao Chen,Hyeong-Do Kim,박제근,Tae Won Noh 한국물리학회 2016 Current Applied Physics Vol.16 No.3
We have studied the electronic structure and interfacial properties of mechanically exfoliated few-layer NiPS3 van der Waals crystals on ZnO/Nb:SrTiO3 substrates using scanning photoelectron microscopy and spectroscopy. The conducting ZnO layer enhances the visibility of few-layer NiPS3 on Nb:SrTiO3 and prevents charging effects in photoemission. We experimentally determined a type-II band alignment at the NiPS3/ZnO interface. The valence band offset (VBO) of few-layer NiPS3/ZnO is 2.8 ± 0.09 eV, and the conduction band offset is 1.0 ± 0.09 eV. Moreover, we found an increase of ~0.3 eV in VBO as decreasing NiPS3 thickness, suggesting electronic coupling or charge transfer at the NiPS3/ZnO interface.