http://chineseinput.net/에서 pinyin(병음)방식으로 중국어를 변환할 수 있습니다.
변환된 중국어를 복사하여 사용하시면 됩니다.
원자 현미경 탐침의 수평방향 힘 교정에 미치는 접촉 강성의 영향
Tran Da Khoa,전기준(Ki-Joon Jeon),정구현(Koo-Hyun Chung) 한국트라이볼로지학회 2012 한국트라이볼로지학회지 (Tribol. Lubr.) Vol.28 No.6
Atomic force microscopy (AFM) has been used for imaging surfaces and measuring surface forces at the nano-scale. Force calibration is important for the quantitative measurement of forces at the nano-scale using AFM. Normal force calibration is relatively straightforward, whereas the lateral force calibration is more complicated since the lateral stiffness of the cantilever is often comparable to the contact stiffness. In this work, the lateral force calibrations of the rectangular cantilever were performed using torsional Sader’s method, thermal noise method, and wedge calibration method. The lateral optical lever sensitivity for the thermal noise method was determined from the friction loop under various normal forces as well. Experimental results showed that the discrepancies among the results of the different methods were as large as 30% due to the effect of the contact stiffness on the lateral force calibration of the cantilever used in this work. After correction for the effect of contact stiffness, all the calibration results agreed with each other, within experimental uncertainties.