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The Proximity Communication을 위한 서브펨토-패러드 커패시턴스 측정회로
홍석하(Seok-Ha Hong),신민석(Min-Seok Shin),권오경(Oh-Kyong Kwon) 대한전자공학회 2007 대한전자공학회 학술대회 Vol.2007 No.7
A new circuit to measure a subfemto-farad coupling capacitance is proposed. This circuit converts current by coupling signal into amplified voltage. This circuit consists of cascode current mirror and trans impedance amplifier to improve the measurement resolution. Simulation results are obtained by HSPICE in a 0.35㎛ CMOS standard technology. When 300 atto-farad capacitance is measured, the maximum error rate is 2.27%.