http://chineseinput.net/에서 pinyin(병음)방식으로 중국어를 변환할 수 있습니다.
변환된 중국어를 복사하여 사용하시면 됩니다.
가속시험을 통한 Electroluminescent film의 활성화 에너지 추정
김수경(Su-Kyoung Kim),형재필(Jae-Phil Hyung),오길구(Gil-Gu Oh),임홍우(Hong-Woo Lim),김명수(Myung-Soo Kim),오근태(Geun-Tae Oh) 한국신뢰성학회 2015 신뢰성응용연구 Vol.15 No.1
In this Study, we tested electroluminescent film to accelerate life by temperature, humidity, voltage, and frequency. We analyzed brightness data to estimate activation energy and verify it’s suitability. All of the tests performed in operating condition. Because electroluminescent film is mostly degraded by fluorescent in operating condition. Two different sample groups were tested and compared to find common parameter.
정의효(Ui-Hyo Jeong),형재필(Jae-Phil Hyung),임성용(Seong-Yong Lim),임홍우(Hong-Woo Lim),장중순(Joong-Soon Jang) 한국신뢰성학회 2014 신뢰성응용연구 Vol.14 No.3
Electrodeless lamp is famous for its long life. But its reliability is dependent not only on electrodes but also on materials and structures. To evaluate end product’s reliability, we studied high temperature durability by 60℃, 75 ℃ and 90 ℃ temperature tests, and predicted failure times by an exponential model through regression analysis. However, the test showed that temperature does not affect degradation of electrodeless lamps. Their luminous outputs degrade during the early time of the test (till 250 hours) and then converge to a saturation points. Also, ‘410nm ~ 530nm’ spectrum degrades more than other spectra.
고분자캐패시터에 대한 충방전 조건에서의 온도에 따른 정전용량감소 특성 연구
정의효(Ui-Hyo Jeong),임홍우(Hong-Woo Lim),형재필(Jae-Phil Hyung),고민지(Min-Ji Ko),정창욱(Chang-Uk Jung),조정하(Jeong-Ha Cho),장중순(Joong-Soon Jang) 한국신뢰성학회 2017 신뢰성응용연구 Vol.17 No.1
Purpose: Polymer capacitors are known to have very high reliability as compared with liquid electrolytic capacitors, but their capacity has been reported to decrease in charge and discharge at low temperature. The purpose of this study to clarify these characteristics. Methods: In order to clarify these characteristics, charging-discharging tests were carried out for 200 hours with three different capacities and at 5 different temperature from 5℃ to 100℃. Results: As a result of the test, it was confirmed that the capacity of the polymer capacitor was decreased with higher capacity and lower temperature. Conclusion: Such a failure phenomenon was caused by the shrinkage and expansion characteristics of the polymer used therein, it is presumed that this failure phenomenon is due to the complex pore structure made by etching.