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COG본딩 공정 중 형성된 기포가 접합 신뢰도에 미치는 영향
최은수(Eun Soo Choi),윤원수(Won-Soo Yun),정영훈(Young Hun Jeong),김보선(Bosun Kim),진송완(Songwan Jin) Korean Society for Precision Engineering 2010 한국정밀공학회지 Vol.27 No.7
The effect of COG bonding parameters, especially the bonding temperature, on the bonding quality and reliability was investigated in this paper. We measured the bubble area formed in the ACF resin during the bonding process and tried to investigate the relationship between bubble area and bonding peel strength. 85/85 test which exposes a sample to a 85% humidity and 85℃ temperature condition was also carried out. The bubble area was dramatically increased under ~10℃ lower than recommended bonding temperature. The bubble area formed at the edge of IC chip was larger than the other parts of IC chip. But the peel strength was not associated with the bubble area. High temperature and humid condition made the bubble area larger, but we could not find clear trend of change in the peel strength.
ACF를 이용한 COG 접합 공정에서 도전볼의 음영비와 접촉 저항과의 관계
진송완(Songwan Jin),정영훈(Young Hun Jeong),최은수(Eun Soo Choi),김보선(Bosun Kim),윤원수(Won-Soo Yun) Korean Society for Precision Engineering 2014 한국정밀공학회지 Vol.31 No.9
Chip on glass (COG) bonding using anisotropic conductive film (ACF) is a key technology to assemble a driver IC onto a LCD glass panel. In this paper, an experimental investigation was conducted to investigate the correlation between contact resistance and characteristics of image taken by machine vision based inspection system. The results show that the contact resistance was strongly influenced by the contrast ratio of conductive particle rather than the number of conductive particles. Also, number of conductive particles whose contrast ratio is below 0.75 is crucial for determining the quality of the assembled samples. On the other hand, in the result of high temperature high humidity storage test, the contrast ratio of samples was increased. However, in the case of open-circuit samples after temperature humidity storage test, the number of conductive particles whose contrast ratio is above 0.75 was more than that of the closed-circuit samples.