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Negative Muon Capture on Nitrogen Oxide Molecules
Kazuhiko Ninomiya,Takashi U. Ito,Wataru Higemoto,Makoto Kita,Atsushi Shinohara,Takashi Nagatomo,Kenya Kubo,Patrick Strasser,Naritoshi Kawamura,Koichiro Shimomura,Yasuhiro Miyake,Taichi Miura 한국물리학회 2011 THE JOURNAL OF THE KOREAN PHYSICAL SOCIETY Vol.59 No.41
The characteristic muonic X-ray measuring system for low pressure gas sample was constructed to investigate the initial process of muonic atom formation. Low background characteristic muonic X-ray spectra were obtained for neon (1.0 bar) and nitrogen mono-oxide samples (0.99 bar) by muon irradiation with 19 MeV/c. The deviation of characteristic muonic X-ray intensity patterns both for muonic nitrogen and oxygen atoms in nitrogen mono-oxide sample between our low pressure experiment and the previous high pressure experiment was found. Muon capture probability was also determined and compared with the previous work and empirical estimations.