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Adhesion properties of 2D materials
Megra, Yonas Tsegaye,Suk, Ji Won IOP 2019 Journal of Physics. D, Applied Physics Vol.52 No.36
<P>Over the past few years, many researchers have been excited with the advent of two-dimensional (2D) materials such as graphene and molybdenum disulfide (MoS<SUB>2</SUB>) because of their intriguing physical and chemical properties. Furthermore, they have great potential in various applications including nanoelectronics, flexible or stretchable devices, energy conversion or storage devices, sensors, nanocomposites, and others. In addition to their electrical, mechanical, optical, and thermal properties, interfacial properties of 2D materials such as adhesion energy have recently attracted attention from researchers since interfacial interactions of 2D materials with others are of great importance in obtaining mechanical integrity of nanomanufacturing processes and related devices. In this respect, this paper reviews the adhesion properties of 2D materials. Measurement methods and characteristics of adhesion behaviors were summarized and discussed mainly for graphene and MoS<SUB>2</SUB>.</P>
서봉현,석지원,Bong Hyun Seo,Yonas Tsegaye Megra,Ji Won Suk 한국복합재료학회 2023 Composites research Vol.36 No.5
To enhance the performance of graphene-based devices, it is of great importance to better understand the interfacial interaction of graphene with its underlying substrates. In this study, the adhesion energy of monolayer graphene placed on dielectric substrates was characterized using mode I fracture tests. Large-area monolayer graphene was synthesized on copper foil using chemical vapor deposition (CVD) with methane and hydrogen. The synthesized graphene was placed on target dielectric substrates using polymer-assisted wet transfer technique. The monolayer graphene placed on a substrate was mechanically delaminated from the dielectric substrate by mode I fracture tests using double cantilever beam configuration. The obtained force-displacement curves were analyzed to estimate the adhesion energies, showing 1.13 ± 0.12 J/m<sup>2</sup> for silicon dioxide and 2.90 ± 0.08 J/m<sup>2</sup> for silicon nitride. This work provides the quantitative measurement of the interfacial interactions of CVD-grown graphene with dielectric substrates.