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Lateral-looking Time-resolved Thermal Wave Microscopy
David H. Hurley,Subhash L. Shinde,Vitalyi E. Gusev 한국물리학회 2010 THE JOURNAL OF THE KOREAN PHYSICAL SOCIETY Vol.57 No.21
Time-resolved thermal wave microscopy was used to measure lateral thermal transport in a thin metallic film on an insulating substrate. The basis of this approach is to decompose the reflectivity signal into a component that varies with delay time and a steady state component that varies with pump modulation frequency. The transient component is a summation of thermal waves at integral multiples of the pulse repetition frequency (76 MHz). The steady state component depends only on thermal waves at the pump chopping frequency (10 - 100 kHz). For long delays, the steady-state component is dominant and can be used to measure the thermal diffusivity.