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Scientific and Engineering Applications of Full-field Swept-sourceOptical Coherence Tomography
Dalip Singh Mehta,Tulsi Anna,Chandra Shakher 한국광학회 2009 Current Optics and Photonics Vol.13 No.3
We report the development of full-field swept-source optical coherence tomography (SS-OCT) in the wavelength range of 815-870 nm using a unique combination of super-luminescent diode (SLD) as broad-band light source and acousto-optic tunable filter (AOTF) as a frequency-scanning device. Some new applications of full-field SS-OCT in forensic sciences and engineering materials have been demonstrated. Results of simultaneous topography and tomography of latent fingerprints, silicon microelectronic circuits and composite materials are presented. The main advantages of the present system are completely non-mechanical scanning, wide-field, compact and low-cost.