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Development of End-milling Inspection System Using 450㎸p Tube Voltage
Moon-Chul Yoon(윤문철),Jin-Seok Jung(정진석),In-Ho Hwang(황인호),Sun-Woo Yuk(육선우),Su-Kang Park(박수강),Do-Hun Chin(진도훈) 한국기계가공학회 2009 한국기계가공학회지 Vol.8 No.2
Transillumination system used by radiation is widely applied to industrial imaging system. In this study, the linear detector array constructed with scintillator and pin diode, and a multi-channel data acquisition system was developed for precision inspection of end-milling. The detector module consists of 16-CdWO₄ crystal scintillator and photodiode array. The detector and data acquisition system was applied to precision inspection of end-mill and the images of the end-mill were successfully reconstructed. The total system can analyze the Detector Quantum Efficiency(DQE) of each system. The performance of developed photodiodes equipment was compared with each other for different crystal geometry and its characteristics. Finally fine details of the end-mill phantom were constructed for industrial application. The image acquired contains several objects on a real time data transfer and the linear X-ray scanning system can be applied to many fields of a industry.