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Senling Wang,Taiga Inoue,Hanan T. Al-Awadhi,Yoshinobu Higami,Hiroshi Takahashi 대한전자공학회 2015 ITC-CSCC :International Technical Conference on Ci Vol.2015 No.6
In this paper, we propose a diagnostic pattern selection method for Resistive Open Faults (RoFs) to handle the excessive power supply noise caused by IR drop. The main idea of the method is to sort out the risky patterns denoted by the detection patterns of the RoFs whose longest sensitized path have high IR drop from a pre-generated test set, and then generates the diagnostic patterns for RoFs by performing x-identification and xfilling process on the risky patterns. The originality of the method is to introduce the Simulated Annealing optimization algorithm to explore the best x-filling for the risky patterns. Experimental results demonstrate the effectiveness of our method.
Diagnosis of Delay Faults in the Presence of Clock Delays Considering Hazards
Yoshinobu Higami,Senling Wang,Hiroshi Takahashi,Shin-ya Kobayashi,Kewal K. Saluja 대한전자공학회 2015 ITC-CSCC :International Technical Conference on Ci Vol.2015 No.6
Presence of hazards can often lead to poor diagnosis. In this paper we propose a diagnosis method for gate delay faults in the presence of clock delays and hazards. Candidate faults are deduced using a fault dictionary which is created by the fault simulation considering hazard signals. Our diagnosis method can deduce candidate faults successfully even when a fault is activated by a hazard signal or when hazard signals are propagated to outputs, though conventional methods without considering hazards often fail to do so.