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The design of a new repetitive sampling control chart based on process capability index
Ahmad, Liaquat,Aslam, Muhammad,Jun, Chi-Hyuck SAGE Publications 2016 Transactions of the Institute of Measurement and C Vol.38 No.8
<P>Control charts are widely used to monitor manufacturing processes for a deterioration in stability. We propose repetitive group sampling control charts based on the process capability index C-pk for monitoring process average when the quality characteristic follows a normal distribution. The performance of the repetitive C-pk control chart is reported and compared with the existing control chart in terms of the average run length. It is found that the proposed control chart is effective for quickly detecting small shifts in the process mean.</P>
Optimal designing of an SkSP-R double sampling plan
Balamurali, Saminathan,Ahmad, Liaquat,Aslam, Muhammad,Hussain, Jaffer,Jun, Chi-Hyuck Informa UK (TaylorFrancis) 2018 Communications in Statistics Vol.47 No.17
<P>In this article, we propose a method of planning and determining the optimum parameters of a SkSP-R skip-lot sampling plan by using the attribute double sampling plan as the reference plan. The SkSP-R plan is a new type of skip-lot sampling plan which has a provision for re-inspecting the submitted lots. The optimal plan parameters of the suggested sampling plan are estimated with the target that the average sample number be minimized and satisfying both the specified producer's as well as the consumer's risks simultaneously. In order to obtain the optimum parameters, tables are also built for different combinations of the acceptable quality level and the limiting quality level in conjunctions with different producer's and consumer's risks. An illustrative example is provided for the implementation of the suggested plan. The advantages of the suggested plan over the existing conventional sampling plans and other existing skip-lot sampling plans are also described.</P>
A control chart for COM-Poisson distribution using a modified EWMA statistic
Aslam, Muhammad,Saghir, Aamir,Ahmad, Liaquat,Jun, Chi-Hyuck,Hussain, Jaffer Informa UK (TaylorFrancis) 2017 JOURNAL OF STATISTICAL COMPUTATION AND SIMULATION Vol.87 No.18
<P>In this paper, a control chart has been developed for the Conway-Maxwell Poisson (COM-Poisson) distribution using the modified exponentially weighted moving average statistic. The proposed chart provides an efficient detection of smaller changes in the location parameter of the COM-Poisson distribution. The performance of the proposed control chart has been evaluated by the average and the standard deviation of the run length distribution for various parameters. Better detecting ability has also been compared with the existing control chart using EWMA statistic. Using simulation, we also showed the detecting ability over the traditional EWMA chart.</P>
A Sampling Plan for the Selection of Supplier using Process Yield Index based on Linear Profiles
Afzal, Kalsoom,Aslam, Muhammad,Jun, Chi-Hyuck,Ahmad, Liaquat Korean Institute of Industrial Engineers 2017 Industrial Engineeering & Management Systems Vol.16 No.2
In this article, a multiple dependent state repetitive (MDSR) sampling plan is developed to choose a more capable process by comparing two suppliers' processes. The proposed MDSR plan is based on the ratio of two process yield indices based on the estimated linear profiles. The linear profile for both processes is estimated by a regression model with a single explanatory variable having the specified number of levels. The operating characteristic function of the proposed plan will be derived. The plan parameters related to the decision rule as well as the sample size are determined by minimizing the average sample number while satisfying the producer's and the consumer's risks.
A Sampling Plan for the Selection of Supplier using Process Yield Index based on Linear Profiles
Kalsoom Afzal,Muhammad Aslam,Chi-Hyuck Jun,Liaquat Ahmad 대한산업공학회 2017 Industrial Engineeering & Management Systems Vol.16 No.2
In this article, a multiple dependent state repetitive (MDSR) sampling plan is developed to choose a more capable process by comparing two suppliers’ processes. The proposed MDSR plan is based on the ratio of two process yield indices based on the estimated linear profiles. The linear profile for both processes is estimated by a regression model with a single explanatory variable having the specified number of levels. The operating characteristic function of the proposed plan will be derived. The plan parameters related to the decision rule as well as the sample size are determined by minimizing the average sample number while satisfying the producer’s and the consumer’s risks.