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A Joint Transform Correlator Encryption System Based on Binary Encoding for Grayscale Images
Kaifei Peng,Xueju Shen,Fuyu Huang,Xuan He 한국광학회 2019 Current Optics and Photonics Vol.3 No.6
A binary encoding method for grayscale images is proposed to address their unsatisfactory decryption results from joint transform correlator (JTC) encryption systems. The method converts the encryption and decryption of grayscale images into that of binary images, and effectively improves decrypted-image quality. In the simulation, we replaced unencoded grayscale images with their binary encoded counterparts in the JTC encryption and decryption processes, then adopted a median filter to suppress saturation noise while keeping other settings unchanged. Accordingly, decrypted-image quality was clearly enhanced as the correlation coefficient (CC) between a decrypted image and its original rose from 0.8237 to 0.9473 initially, and then further to 0.9937, following the above two steps respectively. Finally, optical experimental results confirmed that the proposed encryption system works correctly.
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Laser-induced Damage to Polysilicon Microbridge Component
Bing Zhou,Xuan He,Bingxuan Li,HeXiong Liu,Kaifei Peng 한국광학회 2019 Current Optics and Photonics Vol.3 No.6
Based on the typical pixel structure and parameters of a polysilicon uncooled bolometer, the absorption rate of a polysilicon microbridge infrared detector for 10.6 µm laser energy was calculated through the optical admittance method, and the thermal coupling model of a polysilicon microbridge component irradiated by far infrared laser was established based on theoretical formulas. Then a numerical simulation study was carried out by means of finite element analysis for the actual working environment. It was found that the maximum temperature and maximum stress of the microbridge component are approximately exponentially changing with the laser power of the irradiation respectively and that they increase monotonically. The highest temperature zone of the model is gradually spread by the two corners of the bridge surface that are not connected to the bridge legs, and the maximum stress acts on both sides of the junction of the microbridge legs and the substrate. The mechanism of laser-induced hard damage to polysilicon detectors is the melting damage caused by high temperature. This paper lays the foundation for the subsequent study of the interference mechanism of the laser on working state polysilicon detectors.
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