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- 저자 : Hongwei Qu (검색결과 2 건)
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Temperature dependency of the fill factor in PV modules between 6 and 40 °C
Hongwei Qu,Xingcan Li 대한기계학회 2019 JOURNAL OF MECHANICAL SCIENCE AND TECHNOLOGY Vol.33 No.4
The definition of the fill factor(FF)and a more accurate formula were used to study the temperature dependency of FF. To investigate FF changes as a function of the temperature in the photovoltaic (PV) modules, we used an equivalent circuit diagram that considers series and parallel resistances. Using a measurement setup that allows precise temperature control of the PV modules, the parametersoc V , sc I , m V , m I were measured between 6 and 40 °C. Using the theoretical model, a formula for the FF temperature gradient,¶FF ¶t , could be found. The experimental results show that FF decreases with increasing temperature, and fitting the obtained data points results in a straight line. The FF has a negative temperature coefficient. Specifically, the obtained “defined value” for ¶FF ¶t is -0.00093 1/°C, while the theoretical value is -0.0015 1/°C.
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Huizhou Liu,Jian Yang,Fei Qu,Hua Zhang,Hongwei Gu 한양대학교 세라믹연구소 2006 Journal of Ceramic Processing Research Vol.7 No.4
In research on YBa2Cu3O7 coated conductors, the development of buffer layers for epitaxial growth of YBa2Cu3O7 is very important. In our work, epitaxial buffer layers of Y2O3 have been deposited on biaxially textured Ni and NiW substrates using a continuous electron beam evaporation technique. The surface morphology and texture of Y2O3 buffer layers were characterized using SEM and XRD. The results show a sharp (2 0 0) orientation distribution and a smooth surface. Textured, crack-free, continuous Y2O3 buffer layers were obtained on moving tape using electron beam evaporation. In research on YBa2Cu3O7 coated conductors, the development of buffer layers for epitaxial growth of YBa2Cu3O7 is very important. In our work, epitaxial buffer layers of Y2O3 have been deposited on biaxially textured Ni and NiW substrates using a continuous electron beam evaporation technique. The surface morphology and texture of Y2O3 buffer layers were characterized using SEM and XRD. The results show a sharp (2 0 0) orientation distribution and a smooth surface. Textured, crack-free, continuous Y2O3 buffer layers were obtained on moving tape using electron beam evaporation.
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