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김정종,이창희,하경재,한판암 慶南大學校 附設 工業技術硏究所 1998 硏究論文集 Vol.15 No.3
소프트웨어 개발중에 테스트는 단위 및 통합 테스트는 개발 점검팀(Development Test Team), 확인 및 시스템 테스트는 독립 점검팀(Independent Test Team), 인수 테스트는 인수 점검팀(Customer Test Team)에 의해 수행된다. 그런데 테스트 그룹별로 테스트 수행방법, 절차, 도구, 노력, 요원 등이 서로 다르게 적용되고 있다. 이상과 같은 특징을 고려하여 본 논문에서는 소프트웨어 테스트 단계에서 테스트를 수행하는 테스트 그룹을 기반으로한 SRGM(Software Reliability Growth Model: 소프트웨어 신뢰도 성장 모델)을 제안한다. 그리고 실제 관측된 데이터를 기존의 지연 S자형 SRGM과 본 논문에서 제안한 테스트 그룹형 SRGM을 적용하게 위하여 최우 추정법에 의한 파라미터를 추정하고, 코무로고루프·스미루노프(Kolmogorov-Smirrnov : K-S)검정법으로 모델의 적합도 검정을 수행했다. 그리고 평균치 함수, 기대 잔존 결함수 및 소프트웨어 신뢰도를 추정하여 그 결과를 비교·분석했다. 그 결과 테스트 그룹형SRGM이 실제 데이터에 더 적합한 것으로 나타났다. Unit and integration test, validation and system test, and delivery test is performed by development test team, independent test team, and customer test team respectively in the development of software. Testing methods, procedures, tools, efforts, and man-power differ depending on the test groups. This paper proposes SRGM(Software Reliability Growth Model) based on test groups considering the above characteristics. The parameters are estimated by maximum-likelihood estimation method for the data to be applied th delayed S-shaped SRGM and test group based SRGM. The goodness-of-fit of two models is measured by Kolmogorov-Smirrnov test method. The results are analyzed and compared by estimating mean value function, expected number of remaining errors, and software reliability. The result shows that test group SRGM is fitter than delayed S-shaped SRGM for real data.
저전압/고용량 DRAM 회로를 위한 Half-VDD 전압 발생기 설계
이재형,우엄찬,박무훈,최중경,하판봉,김영희 국립7개대학공동논문집간행위원회 2005 공업기술연구 Vol.5 No.-
A half-VDD voltage generator(VHDD) using PMOS pull-up and NMOS pull-down transistors, and each of the gate voltage is able to swing at CMOS voltage level was newly proposed. Designed with these, pull-up current was made to be proportional to (VDD-|V_(TP)|)^2 and pull-down current was made to be proportional to (VDD-|V_(TN)|)^2. Also, being turned on pull-up and pull-down transistors at the same time was prevented by using short-circuit current protection circuit. Test chips which were designed by using 0.35μm CMOS twin-well process technology were fabricated and the result of measurement was suitable for low-boltage DRAMs.
Pan, Xiaomin,Kim, Ki-Ha,Choi, Jung-Il Elsevier 2019 INTERNATIONAL JOURNAL OF HEAT AND MASS TRANSFER - Vol.144 No.-
<P><B>Abstract</B></P> <P>For a more efficient algorithm, we introduce staggered time discretization to improve the previous method (Pan et al., 2017), fully decoupled monolithic projection method with one Poisson equation (FDMPM-1P), to solve time-dependent natural convection problems. The momentum and energy equations are discretized using the Crank–Nicolson scheme at the staggered time grids, in which temperature and pressure fields are evaluated at half-integer time levels ( n + 1 2 ), while the velocity fields are evaluated at integer time levels ( n + 1 ). Numerical simulations of two-dimensional (2D) Rayleigh–Bénard convection show that the proposed method is more computationally efficient and stable than FDMPM-1P, while preserving the second-order spatial and temporal accuracy. Further, the proposed method provides accurate predictions of 2D Rayleigh–Bénard convection under different thermal boundary conditions for a Rayleigh number up to <SUP> 10 10 </SUP> , three-dimensional turbulent Rayleigh–Bénard convection in the range of 1 × <SUP> 10 5 </SUP> – 2 × <SUP> 10 7 </SUP> in horizontal periodic domain, and three-dimensional turbulent Rayleigh–Bénard convection in the range of 1 × <SUP> 10 6 </SUP> – 1 × <SUP> 10 7 </SUP> in bounded domain. Finally, we theoretically confirmed that the proposed method is second-order in time and it is more stable than FDMPM-1P for small <I>Ra</I>.</P> <P><B>Highlights</B></P> <P> <UL> <LI> We propose VDMPM-STD by improving FDMPM-1P using staggered time discretization. </LI> <LI> The VDMPM-STD allows an explicit decoupling of momentum and energy equations. </LI> <LI> The VDMPM-STD is computationally efficient with the second-order accuracy. </LI> <LI> The VDMPM-STD provides accurate predictions of 2D and 3D RBC problems. </LI> </UL> </P>
혼합가스용 25.8㎸ 가스절연부하개폐기 전계강도 및 절연특성 해석
하정우(Jung-Woo Ha),신판석(Pan-Seok Shin),이동희(Dong-Hee Lee) 대한전기학회 2006 대한전기학회 학술대회 논문집 Vol.2006 No.10
본 연구에서는 25.8㎸ 가스절연부하개폐기에 사용되는 절연매질용 혼합가스에 의한 주요부분 전계 강도 및 절연특성을 유한요소 전자계해석 프로그램 (FLUX2D)을 이용하여 해석하였다 3상, 25.8㎸, 630A 가스절연부하개폐기를 축대칭FEM을 이용하여 개폐시 주요부분 표면전계강도와 혼합가스의 절연특성을 분석하였다. 전계강도 분석결과는 가스절연부하개폐기 설계를 위한 자료로 활용된다.
Kim, Ha-Jeong,Kim, Pan-Kyung,Bae, Sang Mun,Son, Hye-Nam,Thoudam, Debraj Singh,Kim, Jung-Eun,Lee, Byung-Heon,Park, Rang-Woon,Kim, In-San American Society of Hematology 2009 Blood Vol.114 No.25
<B>Abstract</B><P>Transforming growth factor-β-induced protein (TGFBIp)/βig-h3 is a 68-kDa extracellular matrix protein that is functionally associated with the adhesion, migration, proliferation, and differentiation of various cells. The presence of TGFBIp in platelets led us to study the role of this protein in the regulation of platelet functions. Upon activation, platelet TGFBIp was released and associated with the platelets. TGFBIp mediates not only the adhesion and spread of platelets but also activates them, resulting in phosphatidylserine exposure, α-granule secretion, and increased integrin affinity. The fasciclin 1 domains of TGFBIp are mainly responsible for the activation of platelets. TGFBIp promotes thrombus formation on type I fibrillar collagen under flow conditions in vitro and induces pulmonary embolism in mice. Moreover, transgenic mice, which have approximately a 1.7-fold greater blood TGFBIp concentration, are significantly more susceptible to collagen- and epinephrine-induced pulmonary embolism than wild-type mice. These results suggest that TGFBIp, a human platelet protein, plays important roles in platelet activation and thrombus formation. Our findings will increase our understanding of the novel mechanism of platelet activation, contributing to a better understanding of thrombotic pathways and the development of new antithrombotic therapies.</P>
권선단락에 의한 초고압 변압기 권선의 전자력 계산 연구
하정우(Jung-Woo Ha),신판석(Pan-Seok Shin),한성진(Sung-Chin Hahn) 대한전기학회 2006 대한전기학회 학술대회 논문집 Vol.2006 No.7
본 연구에서는 전력계통에서 발생되는 surge나 고장전류에 의해서 변압기의 1차측 코일에 유도되는 전자력의 크기를 유한요소 전자계해석 프로그램(FLUX2D)을 이용하여 해석하였다. 400㎸A, 6600/220(V) 단상 내철형 변압기의 권선간 전자력계산을 축대칭FEM을 이용하여 각방향의 전자력을 분석하였다. 누설자속분포, 전류유입시 권선 상호간에 작용하는 힘의 변화와 힘의 분포, 전류유입시 권선 상호간에 작용하는 힘의 변화와 힘의 분포, 변압기 내부권선의 정상시와 고장전류시의 전자계비교를 전자계 해석을 통하여 변압기에 미치는 영향을 해석하였다. 변압기에 대전류가 유입되는 경우의 전자력 분석결과는 변압기의 절연설계 및 단락기계력에 대한 프레임 구조 설계를 위한 자료로 활용된다.