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Sub-THz characterisation of multi-walled carbon nanotube thin films using vector network analyser
Puthukodan, S.,Dadrasnia, E.,Vinod, V. K. T.,Nguendon, H. K.,Lamela, H.,Ducournau, G.,Lampin, J-F,Garet, F.,Coutaz, J-L,Lee, D-M,Baik, S. IET 2014 Electronics letters Vol.50 No.4
<P>A vector network analyser is used to study the electrical properties of multi-walled carbon nanotube (MWCNT) thin films deposited on a fused quartz substrate in the sub-terahertz (THz) frequency ranges of 220-325 GHz (WR3.4) and 325-500 GHz (WR2.2). The experiment is performed in free space. The complex permittivity of the MWCNT thin films is extracted using the Nicholson-Ross-Weir method. The refractive index and conductivity are then determined from the extracted permittivity. The method is validated by comparison with values obtained using THz time-domain spectroscopy.</P>