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Arifeen, Tooba,Hassan, Abdus Sami,Moradian, Hossein,Lee, Jeong A. Institution of Electrical Engineers 2018 Electronics letters Vol.54 No.15
<P>Area overhead reduction in conventional triple modular redundancy (TMR) by using approximate modules has been proposed in the literature. However, the vulnerability of approximate TMR (ATMR) in the case of a critical input, where faults can lead to errors at the output, is yet to be studied. Here, identifying critical input space through automatic test pattern generation and making it unavailable for the technique of approximating modules of TMR (ATMR) were focused, which involves a prime implicant reduction expansion. The results indicate that the proposed method provides 75-98% fault coverage, which amounts up to 43.8% improvement over that achieved previously. The input vulnerability-aware approach enables a drastic reduction in search space, ranging from 41.5 to 95.5%, for the selection of candidate ATMR modules and no compromise on the area overhead reduction is noticed.</P>