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박상구(Sang-Ku Park),정성연(Sung-Eyen Jeong),김재중(Jae-Jung Kim),손영갑(Young-Kap Son),장석원(Seog-Weon Chang),곽계달(Kae-Dal Kwack) 대한기계학회 2007 대한기계학회 춘추학술대회 Vol.2007 No.10
This paper presents an accelerated life test for bum out of tungsten filament of incandescent lamp. There are many failure modes and failure factors that associated with tungsten filament. But in this explain the dominant failure mode of tungsten filament is the burnout of the filament failure. At first, vapor, high temperature and voltage are selected as stress factors by using of two stage Quality Function Deployment(QFD). And we planed accelerated life test that has two factors(temperature, voltage) and two levels. By experiment it has absorbed that high temperature and over voltage have an effect on the life of the incandescent lamp. Using ALTA programs, we estimated the common shape parameter of Weibull distribution, life-stress relationship, B₁? life and accelerating factors.