http://chineseinput.net/에서 pinyin(병음)방식으로 중국어를 변환할 수 있습니다.
변환된 중국어를 복사하여 사용하시면 됩니다.
강기주(Ki-Ju Kang),임상채(Sang Chai Lim),이상신(Sang Shin Lee),전문창(Moon Chang Jeon),주재황(Jae Hwang Joo) 대한기계학회 2002 대한기계학회 춘추학술대회 Vol.2002 No.5
Recently, the authors have developed a new material test system for thin film at the high temperature. It is so compact and precise with sub micron resolution that it seems to be a useful tool for research of the oxide film growth, its mechanical behavior and failure mechanism. To this end, in this paper three methologies are described for in-situ monitoring of the displacement & strain and the temperature, the oxide thickness. These are the Laser Speckle analysis with digital image correlation technique, the two-color infra-red thermometer und the laser reflection interferometry respectively. The calibration results and some issues which should be addressed for practical application are presented.