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SPICE 기반의 LED 회로 모델을 이용한 신뢰성 분석
김진환(Jin-Hwan Kim),엄해용(Hae-yon Eom),정현준(Hyun-Jun Jung),김용봉(Yong-Bong Kim,),서종욱(Jong-Wook Seo) 대한전자공학회 2007 대한전자공학회 학술대회 Vol.2007 No.7
A SPICE-based 3-dimensional circuit model of LED(Light-Emitting Diode) was used to analyse the failure mechanism of high-brightness LEDs The distributions of internal current and electric field strength were calculated under forward and reverse bias. It was found that the field distribution In the p-layer plays the most significant role in reverse breakdown of blue LEDs.