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RISS 인기검색어
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- 저자 : 송원길 ( Won-kil Song ) (검색결과 3 건)
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송원길(Won Kil Song),이현숙(Hyun Sook Lee),황보라(Bo Ra Hwang),차호연(Ho Yeon Cha),김기영(Ki Young Kim) 한국인체미용예술학회 2010 한국인체미용예술학회지 Vol.11 No.4
Air brush is now not only in car painting but also in body- and nail-painting. So that, practical expression techniques of color, construction and texture in body painting and nail art were investigated by air brush. 6 Pieces of art work are prepared on mannequin and synthetic nail for expression of multi- and mono-color, pictorial technique (free-hand), abstractive motif presented stencils, visual textual and the tactual textual by air brush. In the result, first, airbrush can be used not only the expression of animal and leaves detail image with multi- or mono-color, but also mono color with smooth gradation can be expressed the image perfectly. Second, the feeling with existing picture of Marilyn Munroe and abstractive motif can be expressed by using of pictorial technique and graphic technique with prepared stencils. And separately presented picture was very detail and fine painted, but a assembly picture showed unbalance. Because the area of expressed work may be small and narrow. Third, the visual textual and the tactual textual were expressed and felt truly and realistically. In the conclusion, air brush may be useful tool for coloring, construction and texture expression technique in body painting and nail art.
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지진재해 대비 정밀 FAB. 구조물의 모니터링 시스템 설계
이현준 ( Hyun-jun Lee ),송원길 ( Won-kil Song ),이경오 ( Kyong-oh Lee ) 한국정보처리학회 2013 한국정보처리학회 학술대회논문집 Vol.20 No.1
산업발전에 따라 초정밀 가공/생산/검사 장비를 설치, 운용하는 FAB. 구조물의 건축이 증대되고 있으며, 이에 따라 건물의 환경진동 규제치도 강화되고 있는 실정이다. 한국은 일본이나 동남아 국가들과는 달리 지진에 대한 피해가 직접적으로 보고 되고 있지는 않지만, 동일본 지진에서와 같이 인접국가의 대규모 지진은 초정밀 장비의 작동에 심각한 영향을 준다. 따라서, 본 논문에서는 대규모 지진에 영향을 받는 일반 건물과 미세한 지반 진동에도 영향을 받는 정밀 FAB. 에서 운용이 가능한 범용적인 지진재해 대비 모니터링 시스템의 설계에 대해 서술한다.
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폴리쉬 리무버 반복시술에 따른 손톱의 물리적 성상과 형태학적 변화
이나리 ( Na Ri Lee ),송원길 ( Won Kil Song ),최은미 ( Un Mi Choi ),이현숙 ( Huyn Sook Lee ),김기영 ( Ki Young Kim ) 한국미용학회 2010 한국미용학회지 Vol.16 No.4
Nail products such as polish, polish remover and acrylates are widely used. And nail products have problems and risks of not only nail damage but also neurological abnormality, irritation of skin and mucous, reproductive disorder. So that, the aim of this study is to observe change of physical property and morphology on nail by treatment with nail removers. 5 women`s nails were collected and divided into 3 groups (non-treated, acetone remover treated, acetone free remover treated) and treated with two polish removers in one time, 3-times and 5-times. The thickness of transverse and roughness of surface were measured and observed after polish and polish remover treatment by hair diagnostic apparatus, SEM and AFM. The findings showed that the nails in the acetone-content polish remover group were significantly thin from 5.2±0.1 μm to 4.7±0.3 μm after 3-times of treatment and to 4.3±0.2 μm after 5-times of treatment (p<0.05), while those treated with acetone-free removers became also significantly thin from 5.1±0.1 μm to 4.9±0.1 μm after 3-times and to 4.6±0.1 μm after 5-times of treatment (p<0.05) in compared to non treated group. Observation with SEM from the morphological viewpoint, transverse and surface of the nails in the non-treated group featured relatively solid and high adhesion in the intermediate layer of keratine. After 3- and 5-times of treatment in repeatedly treated group. The aceton plish remover group with some scratches were found to be lysated and clotted and cuticles came off heavily from the transverse. In case of acetone-free remover group, however, a slight crack, clotting and crumbs appeared between layers after 3- and 5-time treatment and peeling off process of cuticles were slower compared to the case of acetone-content polish remover group by observation of SEM. The nails in acetone-content polish remover group was significantly increased in the roughness from 0.56±0.06 μm to 0.66±0.03 μm after 3-times treatment and to 0.78±0.02 μm after 5-times treatment (p<0.05), while the surface treated with acetone-free remover treated group was observed to have slightly increase of roughness from 0.56±0.06 μm to 0.58±0.11 μm after 3 times of treatment and to 0.61±0.02 μm after 5 times by AFM (p<0.05). These data suggested that acetone-free remover may be damaged to nails weaker than acetone-content remover.
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