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Surface relaxation 모델을 이용한 나노박막의 탄성계수 연구
김원배(Wonbae Kim),조맹효(Maenghyo Cho) 대한기계학회 2009 대한기계학회 춘추학술대회 Vol.2009 No.5
Size-dependent elastic properties of thin nanofilms are studied using surface relaxation model. Surface relaxation model is a very powerful framework to predict self-equilibrium strain as substitute for energy minimization. Based on this model, elastic properties of thin nanofilms are calculated by the analytical method, which was developed by Oh and Johnson. As a case study, we carry out the atomistic calculations of size-dependent elastic moduli of nanofilms with {100}, {111}, and {110} crystallographic orientations for the transient metals (Cu, Ag, Au and Ni).
나노박막의 원자적 계산을 위한 Surface relaxation 모델
김원배(Wonbae Kim),조맹효(Maenghyo Cho) 대한기계학회 2009 대한기계학회 춘추학술대회 Vol.2009 No.5
In this paper, we present a surface relaxation model in atomistic calculations for thin nanofilms. This surface relaxation model is very simple model which have only two degrees of freedoms to determine the atom positions of nanofilms. Whereas in conventional molecular statics simulations, the same number of degrees of freedoms as all atom positions are used as variables. In order to prove the reliability of presented model, we present the results of self-equilibrium strain calculations with the surface parameters obtained from this model.
Simulation on Surface Tracking Pattern using the Dielectric Breakdown Model
Kim, Jun-Won,Roh, Young-Su The Korean Institute of Electrical Engineers 2011 Journal of Electrical Engineering & Technology Vol.6 No.3
The tracking pattern formed on the dielectric surface due to a surface electrical discharge exhibits fractal structure. In order to quantitatively investigate the fractal characteristics of the surface tracking pattern, the dielectric breakdown model has been employed to numerically generate the surface tracking pattern. In dielectric breakdown model, the pattern growth is determined stochastically by a probability function depending on the local electric potential difference. For the computation of the electric potential for all points of the lattice, a two-dimensional discrete Laplace equation is solved by mean of the successive over-relaxation method combined to the Gauss-Seidel method. The box counting method has been used to calculate the fractal dimensions of the simulated patterns with various exponent $\eta$ and breakdown voltage $\phi_b$. As a result of the simulation, it is found that the fractal nature of the surface tracking pattern depends strongly on $\eta$ and $\phi_b$.
Simulation on Surface Tracking Pattern using the Dielectric Breakdown Model
Jun-Won Kim,Young-Su Roh 대한전기학회 2011 Journal of Electrical Engineering & Technology Vol.6 No.3
The tracking pattern formed on the dielectric surface due to a surface electrical discharge exhibits fractal structure. In order to quantitatively investigate the fractal characteristics of the surface tracking pattern, the dielectric breakdown model has been employed to numerically generate the surface tracking pattern. In dielectric breakdown model, the pattern growth is determined stochastically by a probability function depending on the local electric potential difference. For the computation of the electric potential for all points of the lattice, a two-dimensional discrete Laplace equation is solved by mean of the successive over-relaxation method combined to the Gauss-Seidel method. The box counting method has been used to calculate the fractal dimensions of the simulated patterns with various exponent η and breakdown voltage Øb. As a result of the simulation, it is found that the fractal nature of the surface tracking pattern depends strongly on η and Øb.