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Selective resolution of phonon modes in STM-IETS on clean and oxygen-adsorbed Cu(100) surfaces
Lee, Minjun,Oh, Myungchul,Jeon, Hoyeon,Yi, Sunwouk,Zoh, Inhae,Zhang, Chao,Chae, Jungseok,Kuk, Young Elsevier 2019 Surface science Vol.689 No.-
<P><B>Abstract</B></P> <P>The observation of surface phonon using scanning probe microscopy can provide important information related to local structural and electrical properties. In this study, surface phonon modes on a Cu(100) surface were measured using inelastic tunneling spectroscopy of scanning tunneling microscopy. One phonon mode was measured at 3.6 meV on a clean Cu(100) surface. On an oxygen-adsorbed Cu(100) surface, another phonon mode was measured at 13.5 meV. This phonon mode was considered to be enhanced by the symmetry created by Cu-missing rows. The spatially varying <I>d<SUP>2</SUP>I/dV<SUP>2</SUP> </I> map showed the effect of surface stress relaxation.</P> <P><B>Highlights</B></P> <P> <UL> <LI> We measured the surface phonon modes on a bare Cu(100) surface and two reconstructed oxidized Cu(100) surfaces. </LI> <LI> These measurements were performed with different selection rules owing to the structures of the surfaces and the probing tips. </LI> <LI> A geometrically sharp STM tip was an important factor for resolving many phonon mode peaks on the surface. </LI> <LI> The symmetry of the phonon modes was directly related to the STM-IETS signal strength. </LI> <LI> Broken symmetry due to surface stress relaxation can be another factor determining the STM-IETS signal. </LI> </UL> </P> <P><B>Graphical abstract</B></P> <P>[DISPLAY OMISSION]</P>