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저면적 12비트 1MSps 연속 근사형 레지스터 아날로그-디지털 변환기 설계
성명우(Myeong-U Seong),이정훈(Jung-Hoon Lee),류지열(Jee-Youl Ryu) 한국정보기술학회 2015 한국정보기술학회논문지 Vol.13 No.2
This paper proposes a low area 12-bit 1MSps SAR ADC(Successive Approximation Register Analog-to-Digital Converter). The proposed circuit is designed using Magnachip/SK Hynix 1-Poly 6-Metal 0.18-μm CMOS process, and it is powered by a 1.8-V supply. Total chip area is reduced by replacing the MIM capacitors with MOS capacitors instead of the capacitors consisting of overall part in chip area. We designed optimized circuit as compared to conventional circuits by reducing the unit capacitors and number of the total capacitors to reduce power dissipation. The proposed circuit in this paper showed improved power dissipation of 1.93mW, and chip area of 0.51mm² as compared to conventional research results at the input frequency of 100kHz and power supply of 1.8V. The designed circuit also showed high SNDR(Signal-to-Noise Distortion Ratio) of 70.51dB, and excellent effective number of bits of 11.4bits.
성명우(Myeong-U Seong),류지열(Jee-Youl Ryu) 한국정보기술학회 2018 한국정보기술학회논문지 Vol.16 No.1
This paper presents high-precision low-cost digital portable hardness tester using the Leeb rebound hardness test method. The Leeb rebound test method is generally easier to measure, and more accurate than other types of hardness testing methods. This method is used on all metals, except in condition where the test metal structure or surface conditions would introduce too much variations. This portable method is also used for testing efficiently hardness of surface and unreachable edges of large metal workpiece(mainly above 1kg). The proposed hardness tester consists of sensor probes(impact devices) of 7-type to measure Leeb rebound and embedded system unit for its control and signal processing. This hardness tester showed resolution of more than 20%, measurement accuracy of more than 25%, cost effective of 33% and response time of 15msec for the various test samples as compared to conventional hardness tester. We believe that this tester is widely used in the metal industries to measure hardness.
시스템-온-칩을 위한 12비트 1MSps 연속 근사형 아날로그-디지털 변환기 설계
최성규(Seong-Kyu Choi),성명우(Myeong-U Seong),김성우(Sung-Woo Kim),류지열(Jee-Youl Ryu) 한국정보기술학회 2014 한국정보기술학회논문지 Vol.12 No.5
This paper proposes a 12-bit 1MSps SAR ADC(Successive Approximation Register Analog-to-Digital Converter) for SoC(System-on-Chip). The proposed circuit is designed using Magnachip/SK Hynix 0.18㎛ CMOS 1Poly-6Metal process, and it is powered by 1.8 supply. To reduce chip area and power dissipation, we minimized unit capacitor area and number of the total capacitors, and designed the circuit considering optimization as compared to conventional circuits. The proposed circuit in this paper showed high SNDR(Signal-to-Noise Distortion Ratio) of 70.03dB, and excellent effective bit number of 11.34-bit as compared to conventional research results. The designed circuit also showed low power dissipation of 5.5mW, and small chip area of 0.56mm2. The proposed ADC is applicable for the signal conversion of the industry system application.