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Decision diagram based methods and reliability analysis for k-out-of-n: G systems
Shumin Li,Shudong Sun,Shubin Si,Shuai Zhang,Hongyan Dui 대한기계학회 2014 JOURNAL OF MECHANICAL SCIENCE AND TECHNOLOGY Vol.28 No.10
Binary k-out-of-n systems are commonly used reliability models in engineering practice. Many authors have extended the concept ofk-out-of-n system to multi-state k-out-of-n systems. This paper proposes a binary decision diagram (BDD) based approach for binary kout-of-n: G system and a multi-state multi-valued decision diagram (MMDD) based approach for multi-state k-out-of-n: G system. BDDand MMDD have been extensively used for representing and manipulating logic functions in many areas, including reliability modelingand analysis. In this paper, patterns of BDD/MMDD for binary/multi-state k-out-of-n: G system are summarized and proved, a two-stepalgorithmic process is proposed for modeling the BDD/MMDD and three case studies are implemented to demonstrate the presentedmethods. Complexity analysis shows that the presented method is more computationally efficient than the traditional algorithms for kout-of- n: G system.
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