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RISS 인기검색어
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- 주제어 : Maximum Expected Surplus Loss (검색결과 2 건)
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Variable Sampling Inspection with Screening When Lot Quality Follows Mixed Normal Distribution
Yuichiro Suzuki,Yasuhiko Takemoto,Ikuo Arizono 대한산업공학회 2009 Industrial Engineeering & Management Systems Vol.8 No.3
The variable sampling inspection scheme with screening for the purpose of assuring the upper limit of maximum expected surplus loss after inspection has been proposed. In this inspection scheme, it has been assumed that a product lot consists of products manufactured through a single production line and lot quality characteristics follow a normal distribution. In the previous literature with respect to inspection schemes, it has been commonly assumed that lot quality characteristics obey a single normal distribution under the condition that all products are manufactured in the same condition. On the other hand, the production line is designed in order that the workload of respective processes becomes uniform from the viewpoint of line balancing. One of the solutions for the bottleneck process is to arrange the workshops in parallel. The lot quality characteristics from such a production line with the process consisting of some parallel workshops might not follow strictly the single normal distribution. Therefore, we expand an applicable scope of the above mentioned variable sampling inspection scheme with screening in this article. Concretely, we consider the variable sampling inspection with screening for the purpose of assuring the upper limit of average outgoing surplus quality loss in the production lots when the lot quality follows the mixed normal distribution.
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Variable Sampling Inspection with Screening When Lot Quality Follows Mixed Normal Distribution
Suzuki, Yuichiro,Takemoto, Yasuhiko,Arizono, Ikuo Korean Institute of Industrial Engineers 2009 Industrial Engineeering & Management Systems Vol.8 No.3
The variable sampling inspection scheme with screening for the purpose of assuring the upper limit of maximum expected surplus loss after inspection has been proposed. In this inspection scheme, it has been assumed that a product lot consists of products manufactured through a single production line and lot quality characteristics follow a normal distribution. In the previous literature with respect to inspection schemes, it has been commonly assumed that lot quality characteristics obey a single normal distribution under the condition that all products are manufactured in the same condition. On the other hand, the production line is designed in order that the workload of respective processes becomes uniform from the viewpoint of line balancing. One of the solutions for the bottleneck process is to arrange the workshops in parallel. The lot quality characteristics from such a production line with the process consisting of some parallel workshops might not follow strictly the single normal distribution. Therefore, we expand an applicable scope of the above mentioned variable sampling inspection scheme with screening in this article. Concretely, we consider the variable sampling inspection with screening for the purpose of assuring the upper limit of average outgoing surplus quality loss in the production lots when the lot quality follows the mixed normal distribution.
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